Electron microscopy measurements of electron orbitals
Quantitative characterization and real-space mapping of the electron orbital are highly desirable as it’s a basic orderparameter linking microscopic electronic structure and macroscopic properties in material science. Here we brieflyre-view the recent progress in the measurements of orbital populations via electron microscopic methods, includingquant-itative convergent-beam electron diffraction (QCBED), electron energy-loss spectroscopy (EELS) and others. Combingwith the rapid development of four-dimensional scanning transmission electron microscopy (4D-STEM), we propose thefuture potential directions and discuss possible solutions towards real-space orbital mapping at atomic scale.
Authors
- Lin Gu (ORCID: https://orcid.org/0000-0002-7504-031X)
Publication Details
- Journal
- Materials Lab
- Published
- 2025-01-01
- DOI
- https://doi.org/10.54227/mlab.20250002
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Science Fund for Creative Research Groups