Analysis of a Digitizer Circuit With T-Network for Low-Resistance Measurement
An efficient interfacing circuit designed for measuring low resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i>, less than 1 Ω) and generating a digital output is presented. The digitizer (resistance to digital converter, RDC) circuit utilizes a dual-slope integrator with a T-network in feedback, three single pole single throw (SPDT) switches, and a comparator. Conventional dual-slope integrators face challenges when measuring low <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> connected to the inverting terminal, as the high input current causes the op-amp to saturate. Reducing the input voltage to even 0.01 <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> doesn’t resolve this issue. Alternatively, connecting <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> in feedback produces a low output voltage that is susceptible to inherent circuit noise, leading to significant measurement errors. Consequently, no digitizers have been developed to accurately measure <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> below 10 Ω so far. The circuit overcomes these limitations by using a T-network which enables the incoming current (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I<sub>X</sub></i>, 98.09 - 71.75 μA) through <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> to amplify the feedback current (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I<sub>C</sub></i>), hence significantly improving sensitivity which is a novel feature. During charging, lead resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>L</sub></i>) with fixed resistance <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> (or <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i>) is measured, while during discharging, <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>L</sub></i> are measured together. Subtracting <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>L</sub></i> ensures accurate <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> measurement, independent of <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>L</sub></i>, in a two-wire configuration. The circuit is experimentally tested for <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i> in the range of 0.1 - 0.9 Ω (full span) in which the power dissipation ranges from 0.96 - 4.63 nW, while the measurement time varies from 1.29 - 1.51 s. The circuit yields accurate results with an average error of ± 0.68% across the full span of <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>X</sub></i>.
Authors
- Gopal Singh (ORCID: https://orcid.org/0000-0002-2312-7966)
- Shiraz Sohail (ORCID: https://orcid.org/0000-0003-1285-2596)
- Tarikul Islam (ORCID: https://orcid.org/0000-0002-1901-239X)
Institutions
- National Institute of Technology Tiruchirappalli (IN)
- Jamia Millia Islamia (IN)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3560721
- Citations
- 2
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 2.97