Influence of Alloying Elements on the Phase Structure, Stress–Strain Behavior, and Fracture Toughness of Ni3Sn: A First-Principles Study
Transient liquid-phase bonding (TLPB) enables the low-temperature fabrication of encapsulated solder joints with high-temperature resistance and electromigration resilience; yet, Ni-Sn TLPB joints suffer from brittle fracture due to intermetallic compounds (IMCs). This study investigates the Co, Cu, and Pt alloying effects on Ni<sub>3</sub>Sn via formation energy, molecular dynamics, and first-principles calculations. Occupancy models of Ni<sub>6-x</sub>M<sub>x</sub>Sn<sub>2</sub> (M = Co, Cu, and Pt) were established, with the lattice parameters, B/G ratios, fracture toughness (K<sub>IC</sub>), and stress-strain behaviors analyzed. The results reveal that Co enhances fracture toughness and reduces Ni<sub>3</sub>Sn anisotropy, mitigating microcrack risks, while Cu/Pt introduce antibonding interactions (Cu-Sn and Pt-Sn), weakening the bonding strength. The classical B/G brittleness criterion proves inapplicable in Ni-M-Sn systems due to mixed bonding (metallic/covalent) and the hexagonal structure's limited slip systems. The Ni<sub>6-x</sub>Co<sub>x</sub>Sn<sub>2</sub> formation improves toughness with a low Co content, supported by an electronic structure analysis (density of states and Bader charges). The thermodynamic stability and reduced molar shrinkage (Ni + Sn → Ni<sub>3</sub>Sn) confirm Co's efficacy in optimizing Ni-Sn solder joints.
Authors
- Mingdong Bao (ORCID: https://orcid.org/0000-0002-4439-6137)
- Jiaoyan Dai (ORCID: https://orcid.org/0000-0002-4997-5496)
- Haotian Zhang (ORCID: https://orcid.org/0009-0005-6082-7389)
- Yanjie Zhang (ORCID: https://orcid.org/0000-0002-6662-7485)
- Yanping Yin
- Yue Cao (ORCID: https://orcid.org/0000-0003-2632-2983)
Institutions
- Ningbo University of Technology (CN)
- Chang'an University (CN)
Publication Details
- Journal
- Materials
- Published
- 2025-04-14
- DOI
- https://doi.org/10.3390/ma18081792
- Citations
- 1
- Primary Topic
- Electronic Packaging and Soldering Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73