Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex
Gas-assisted focused electron beam-induced deposition (FEBID) as a direct, minimally invasive 3D nanopatterning tool offers many advantages in making nanostructures with complex shapes and novel compositions for evolving nanotechnological applications. In this work, structures were nanoprinted using a fluorine-free β-ketoesterate complex, bis(<i>tert</i>-butylacetoacetate)palladium(II), [Pd(tbaoac)<sub>2</sub>]. The internal nanostructure and composition of the deposits were determined, and possible volatile products produced under electron-induced dissociation, explaining the composition, are investigated. A method to eliminate the residual gas contamination during FEBID was implemented. [Pd(tbaoac)<sub>2</sub>] contains large organic ligands and only about 5 atom % palladium in the pristine molecule, yet the obtained palladium content in the deposits amounts to around 30 atom %. This translates to an exceptional removal efficiency of about 90% for the ligand-constituting elements carbon and oxygen through electron-induced dissociation and desorption mechanisms. Comparison with other precursors confirms that the β-ketoesterate family has the highest ligand removal percentage and constitutes thus an interesting model chemistry for further high-metal-content FEBID studies. The possibility of growing nanopillars makes this complex a promising precursor for nanoprinting 3D structures with finely focused electron beams.
Authors
- Ivo Utke (ORCID: https://orcid.org/0000-0002-9877-2601)
- Krzysztof Maćkosz (ORCID: https://orcid.org/0000-0002-7479-6510)
- P. Hoffmann (ORCID: https://orcid.org/0000-0002-7924-6219)
- Iwona B. Szymańska (ORCID: https://orcid.org/0000-0002-1951-3733)
- Aleksandra Butrymowicz-Kubiak (ORCID: https://orcid.org/0000-0002-3885-1623)
- Chinmai Sai Jureddy
Institutions
- Centre National de la Recherche Scientifique (FR)
- Nicolaus Copernicus University (PL)
- Institut de Physique de Rennes (FR)
- École Polytechnique Fédérale de Lausanne (CH)
- Université de Rennes (FR)
- Swiss Federal Laboratories for Materials Science and Technology (CH)
Publication Details
- Journal
- Beilstein Journal of Nanotechnology
- Published
- 2025-04-15
- DOI
- https://doi.org/10.3762/bjnano.16.41
- Citations
- 1
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 2.55
Funders
- National Science Foundation
- Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung
- Horizon 2020 Framework Programme