Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

Gas-assisted focused electron beam-induced deposition (FEBID) as a direct, minimally invasive 3D nanopatterning tool offers many advantages in making nanostructures with complex shapes and novel compositions for evolving nanotechnological applications. In this work, structures were nanoprinted using a fluorine-free β-ketoesterate complex, bis(<i>tert</i>-butylacetoacetate)palladium(II), [Pd(tbaoac)<sub>2</sub>]. The internal nanostructure and composition of the deposits were determined, and possible volatile products produced under electron-induced dissociation, explaining the composition, are investigated. A method to eliminate the residual gas contamination during FEBID was implemented. [Pd(tbaoac)<sub>2</sub>] contains large organic ligands and only about 5 atom % palladium in the pristine molecule, yet the obtained palladium content in the deposits amounts to around 30 atom %. This translates to an exceptional removal efficiency of about 90% for the ligand-constituting elements carbon and oxygen through electron-induced dissociation and desorption mechanisms. Comparison with other precursors confirms that the β-ketoesterate family has the highest ligand removal percentage and constitutes thus an interesting model chemistry for further high-metal-content FEBID studies. The possibility of growing nanopillars makes this complex a promising precursor for nanoprinting 3D structures with finely focused electron beams.

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Publication Details

Journal
Beilstein Journal of Nanotechnology
Published
2025-04-15
DOI
https://doi.org/10.3762/bjnano.16.41
Citations
1
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
2.55

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article

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

Ivo Utke, Krzysztof Maćkosz, P. Hoffmann, Iwona B. Szymańska et al.
1 citations
Beilstein Journal of Nanotechnology
Advanced Electron Microscopy Techniques and Applications
2.55
article

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

Ivo Utke, Krzysztof Maćkosz, P. Hoffmann, Iwona B. Szymańska, Aleksandra Butrymowicz-Kubiak, Chinmai Sai Jureddy
article en
1 citations

Abstract

Gas-assisted focused electron beam-induced deposition (FEBID) as a direct, minimally invasive 3D nanopatterning tool offers many advantages in making nanostructures with complex shapes and novel compositions for evolving nanotechnological applications. In this work, structures were nanoprinted using a fluorine-free β-ketoesterate complex, bis(<i>tert</i>-butylacetoacetate)palladium(II), [Pd(tbaoac)<sub>2</sub>]. The internal nanostructure and composition of the deposits were determined, and possible volatile products produced under electron-induced dissociation, explaining the composition, are investigated. A method to eliminate the residual gas contamination during FEBID was implemented. [Pd(tbaoac)<sub>2</sub>] contains large organic ligands and only about 5 atom % palladium in the pristine molecule, yet the obtained palladium content in the deposits amounts to around 30 atom %. This translates to an exceptional removal efficiency of about 90% for the ligand-constituting elements carbon and oxygen through electron-induced dissociation and desorption mechanisms. Comparison with other precursors confirms that the β-ketoesterate family has the highest ligand removal percentage and constitutes thus an interesting model chemistry for further high-metal-content FEBID studies. The possibility of growing nanopillars makes this complex a promising precursor for nanoprinting 3D structures with finely focused electron beams.

Beilstein Journal of NanotechnologyVol. 16
Centre National de la Recherche Scientifique (FR), Nicolaus Copernicus University (PL), Institut de Physique de Rennes (FR), École Polytechnique Fédérale de Lausanne (CH), Université de Rennes (FR), Swiss Federal Laboratories for Materials Science and Technology (CH)
National Science Foundation, Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung, Horizon 2020 Framework Programme
Openalex Percentile: Top 11%
Advanced Electron Microscopy Techniques and Applications
2.55
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