Research on the influence of ultraviolet radiation on OLEDs and the luminance attenuation model of light aging

We investigated the degradation performance of organic light-emitting diodes (OLEDs) under different ultraviolet (UV) irradiation intensities and demonstrated that the stretched exponential decay (SED) model, applicable in electrical aging, is also suitable for describing the luminance-time curves in photoaging. In this way, OLED lifetime acquired at low UV illumination could be fitted with that obtained at high illumination. We also demonstrated how UV radiation affects the interface at the ITO/hole transport layer, which led to its degradation. This was elucidated through changes in the mobility of single-carrier devices and XPS characterization of the films before and after UV irradiation. These findings reveal the external behavior and internal mechanism of OLEDs in light aging, providing a reliable research direction for enhancing the stability of organic electronic devices.

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Publication Details

Journal
Physical Chemistry Chemical Physics
Published
2025-01-01
DOI
https://doi.org/10.1039/d5cp00664c
Citations
2
Primary Topic
Color Science and Applications
Type
article
Field-Weighted Citation Impact
2.49
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article

Research on the influence of ultraviolet radiation on OLEDs and the luminance attenuation model of light aging

Jialu Gu, Bin Wei, Wei Shi, Weixia Lan et al.
2 citations
Physical Chemistry Chemical Physics
Color Science and Applications
2.49
article

Research on the influence of ultraviolet radiation on OLEDs and the luminance attenuation model of light aging

Jialu Gu, Bin Wei, Wei Shi, Weixia Lan, Yachen Xu, Zhanhan Hu, Yixiao Zhang, Yangyang Zhu, Lulu Zhou, Yi Liao
article en
2 citations

Abstract

We investigated the degradation performance of organic light-emitting diodes (OLEDs) under different ultraviolet (UV) irradiation intensities and demonstrated that the stretched exponential decay (SED) model, applicable in electrical aging, is also suitable for describing the luminance-time curves in photoaging. In this way, OLED lifetime acquired at low UV illumination could be fitted with that obtained at high illumination. We also demonstrated how UV radiation affects the interface at the ITO/hole transport layer, which led to its degradation. This was elucidated through changes in the mobility of single-carrier devices and XPS characterization of the films before and after UV irradiation. These findings reveal the external behavior and internal mechanism of OLEDs in light aging, providing a reliable research direction for enhancing the stability of organic electronic devices.

Physical Chemistry Chemical PhysicsVol. 27(19)
Shanghai University (CN), Ministry of Education (CL), North China Institute of Aerospace Engineering (CN)
Openalex Percentile: Top 12%
Color Science and Applications
2.49
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