Multi-Scale Localization and Attention Mechanism for Fine-Grained Image Classification
Fine-grained image classification tasks present a notable challenge, images within the same class can exhibit substantial intra-class variation, while the differences between distinct classes are often minimal. As a result, identifying the key distinguishing features in the images is essential for tackling this issue. This paper introduces an Attention Object Localization Module (AOLM) that predicts object locations, combined with a Weakly Supervised Part Localization Module (WPLM) to identify informative parts of the image. Additionally, a Convolutional Block Attention Module (CBAM) is applied to highlight important features and suppress less relevant ones. To enhance the model's classification accuracy, a multi-class ResNet backbone is used. Evaluations on three well-known benchmark datasets—CUB-200-2011, Stanford Cars, and FGVC-Aircraft—resulted in accuracies of 90.5%, 95.0%, and 95.0%, respectively, showcasing the effectiveness of the proposed method in fine-grained image classification.
Authors
- Chunyu Chen (ORCID: https://orcid.org/0009-0006-7766-0519)
- Xinyu Zhao (ORCID: https://orcid.org/0000-0002-2336-4048)
Institutions
- Harbin Engineering University (CN)
Publication Details
- Published
- 2024-11-22
- DOI
- https://doi.org/10.1109/icicml63543.2024.10958076
- Primary Topic
- Image Processing Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00