THE WORK TO COUNTER DESTRUCTIVE IMPACT AT THE TESTING STAGE OF A PRELIMINARY SPECIAL-PURPOSE MICROCIRCUITS

The article presents the results of the analysis of existing approaches to the organization of work to counteract destructive influence at the stage of testing a prototype of special-purpose microcircuits. The key features of these works are highlighted and an approach to the organization of measures to counteract destructive influence is proposed, which allows preventing the detection and determination of the characteristics of a sample of special-purpose microcircuits.