Band Alignment among CNTs with Varying Diameters and Schottky Barrier Fluctuations between CNTs and Metals: A First-Principles Study

In carbon nanotube thin film transistors (CNT-TFTs), the performance is significantly influenced by the fluctuation in the diameter of the CNTs in channel. In this work, first-principles calculations were employed to explore the fluctuations in the valence band maximum and conduction band minimum of CNTs with diameters ranging from 0.78 to 2.07 nm. Band alignment analysis reveals maximum offsets reach 0.54 eV for the valence band and 0.48 eV for the conduction band, with larger CNTs (diameters over 1.8 nm) exhibiting energy band fluctuations of less than 0.06 eV. Further analysis shows that the fluctuation in Schottky barrier height (SBH) is smaller between CNTs and Pd compared to CNTs and Ti. Atomistic simulations of Pd-CNT-Pd devices at −2 V demonstrate that the variation in on-state current between 1.49 and 2.04 nm CNTs is six times smaller than that between 1.02 and 1.49 nm CNTs. This indicates that inter-nanotube fluctuations in larger-diameter CNTs have a smaller impact on device current compared to fluctuations in smaller-diameter CNTs. These findings suggest that larger-diameter CNTs (greater than 1.8 nm) enhance the uniformity of electrical properties, presenting a promising approach to improving the reliability of CNT-based thin-film devices.

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Publication Details

Journal
ACS Applied Nano Materials
Published
2025-04-14
DOI
https://doi.org/10.1021/acsanm.5c00541
Citations
1
Primary Topic
Semiconductor materials and interfaces
Type
article
Field-Weighted Citation Impact
1.25

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article

Band Alignment among CNTs with Varying Diameters and Schottky Barrier Fluctuations between CNTs and Metals: A First-Principles Study

Bo Li, Fanyu Liu, Yu‐Qing Zhao, Maguang Zhu et al.
1 citations
ACS Applied Nano Materials
Semiconductor materials and interfaces
1.25
article

Band Alignment among CNTs with Varying Diameters and Schottky Barrier Fluctuations between CNTs and Metals: A First-Principles Study

Bo Li, Fanyu Liu, Yu‐Qing Zhao, Maguang Zhu, Yuanjun Tang, Zhenping Wu, Tao Zhang, Fan Zhang, Lei Wang, Huiping Zhu, Yang Zhang
article en
1 citations

Abstract

In carbon nanotube thin film transistors (CNT-TFTs), the performance is significantly influenced by the fluctuation in the diameter of the CNTs in channel. In this work, first-principles calculations were employed to explore the fluctuations in the valence band maximum and conduction band minimum of CNTs with diameters ranging from 0.78 to 2.07 nm. Band alignment analysis reveals maximum offsets reach 0.54 eV for the valence band and 0.48 eV for the conduction band, with larger CNTs (diameters over 1.8 nm) exhibiting energy band fluctuations of less than 0.06 eV. Further analysis shows that the fluctuation in Schottky barrier height (SBH) is smaller between CNTs and Pd compared to CNTs and Ti. Atomistic simulations of Pd-CNT-Pd devices at −2 V demonstrate that the variation in on-state current between 1.49 and 2.04 nm CNTs is six times smaller than that between 1.02 and 1.49 nm CNTs. This indicates that inter-nanotube fluctuations in larger-diameter CNTs have a smaller impact on device current compared to fluctuations in smaller-diameter CNTs. These findings suggest that larger-diameter CNTs (greater than 1.8 nm) enhance the uniformity of electrical properties, presenting a promising approach to improving the reliability of CNT-based thin-film devices.

ACS Applied Nano MaterialsVol. 8(16)
Hunan University of Science and Technology (CN), Beijing University of Posts and Telecommunications (CN), Chinese Academy of Sciences (CN), Sensors (United States) (US), Photonics (United States) (US), Sensor Electronics (United States) (US), State Key Laboratory of Information Photonics and Optical Communications, Nanjing University (CN)
National Natural Science Foundation of China, Youth Innovation Promotion Association of the Chinese Academy of Sciences, National Key Research and Development Program of China, Fundamental Research Funds for the Central Universities, Bureau of Frontier Sciences and Education, Chinese Academy of Sciences
Openalex Percentile: Top 22%
Semiconductor materials and interfaces
1.25
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