An Original Positive-Up-Negative-Down Protocol for Electrical Characterization of Antiferroelectric Materials

This work introduces the AFE-PUND measurement method, an original positive up negative down (PUND) protocol intended to accurately study antiferroelectric (AFE) thin-film behavior. As for its FE counterpart, the AFE-PUND method isolates switching currents from nonswitching contributions, enabling a precise extraction of saturation polarization and coercive fields from hysteresis loop curves. In this paper, AFE-PUND was deployed on AFE ZrO<sub>2</sub> films of varying thicknesses. The results reveal that saturation polarization increases with film thickness, indicating enhanced domain stability, while endurance cycles showcase the wake-up effect and its eventual fatigue-induced degradation in thicker films. Similarly, coercive fields decrease with thickness, reflecting reduced switching barriers and a sharper transition between the tetragonal and orthorhombic phases. AFE-PUND establishes itself as an extremely valuable method for advancing the understanding and optimization of AFE materials.

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Publication Details

Journal
Nano Letters
Published
2025-04-14
DOI
https://doi.org/10.1021/acs.nanolett.5c00851
Citations
3
Primary Topic
Ferroelectric and Negative Capacitance Devices
Type
article
Field-Weighted Citation Impact
2.19

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article

An Original Positive-Up-Negative-Down Protocol for Electrical Characterization of Antiferroelectric Materials

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3 citations
Nano Letters
Ferroelectric and Negative Capacitance Devices
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article

An Original Positive-Up-Negative-Down Protocol for Electrical Characterization of Antiferroelectric Materials

M. Le Berre, Grégoire Magagnin, Damien Deleruyelle, Brice Gautier, Jordan Bouaziz, Sara Gonzalez, Bertrand Vilquin
article en
3 citations

Abstract

This work introduces the AFE-PUND measurement method, an original positive up negative down (PUND) protocol intended to accurately study antiferroelectric (AFE) thin-film behavior. As for its FE counterpart, the AFE-PUND method isolates switching currents from nonswitching contributions, enabling a precise extraction of saturation polarization and coercive fields from hysteresis loop curves. In this paper, AFE-PUND was deployed on AFE ZrO<sub>2</sub> films of varying thicknesses. The results reveal that saturation polarization increases with film thickness, indicating enhanced domain stability, while endurance cycles showcase the wake-up effect and its eventual fatigue-induced degradation in thicker films. Similarly, coercive fields decrease with thickness, reflecting reduced switching barriers and a sharper transition between the tetragonal and orthorhombic phases. AFE-PUND establishes itself as an extremely valuable method for advancing the understanding and optimization of AFE materials.

Nano LettersVol. 25(16)
Université Claude Bernard Lyon 1 (FR), École Centrale de Lyon (FR), Centre National de la Recherche Scientifique (FR), Institut des Nanotechnologies de Lyon (FR), Institut National des Sciences Appliquées de Lyon (FR), École d'Ingénieurs en Chimie et Sciences du Numérique (FR)
European Commission, Agence Nationale de la Recherche, Unitatea Executiva pentru Finantarea Invatamantului Superior, a Cercetarii, Dezvoltarii si Inovarii, Fundação para a Ciência e a Tecnologia, H2020 LEIT Advanced Materials
Openalex Percentile: Top 13%
Ferroelectric and Negative Capacitance Devices
2.19
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