An Integrated Multioutput Classification-Based Defect Diagnosis Model for Pick-and-Place Machines

Surface mount technology (SMT) is a method to mount components directly onto printed circuit boards (PCBs) and is widely used in low-cost and high-density electronic assemblies. Pick-and-place (P&P) is a core procedure for component placing after the solder paste printing (SPP) process in SMT. Generally, the industry uses an automated optical inspection (AOI) machine to detect defects after the components are mounted. However, the AOI machine cannot discern the failures’ root causes and offer reliable P&P machine maintenance references. With the advent of Industry 4.0, machine learning (ML) methods can be applied to improve production line maintenance. Therefore, the traditional check-up process can be changed into a data-driven, predictive, and condition-based maintenance process. Production efficiency can be significantly increased. In this article, a multioutput classification-based defect diagnosis (MCDD) model has been developed to trace the root causes of defects by using the patterns discovered from the experiment data. The experiments with initial machine errors are conducted and investigation information is collected. Compared with the traditional root cause identification model, the developed model is easier to adjust and can achieve an overall classification accuracy of 84.5%. Furthermore, the transfer learning method has been used to apply the trained model for one component to other components and can achieve an accuracy of 81.74%.

Authors

Institutions

Publication Details

Journal
IEEE Transactions on Components Packaging and Manufacturing Technology
Published
2025-03-05
DOI
https://doi.org/10.1109/tcpmt.2025.3548548
Citations
1
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
1.24
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

An Integrated Multioutput Classification-Based Defect Diagnosis Model for Pick-and-Place Machines

Yuqiao Cen, Daehan Won, Jingxi He
1 citations
IEEE Transactions on Components Packaging and Manufacturing Technology
Industrial Vision Systems and Defect Detection
1.24
article

An Integrated Multioutput Classification-Based Defect Diagnosis Model for Pick-and-Place Machines

Yuqiao Cen, Daehan Won, Jingxi He
article en
1 citations

Abstract

Surface mount technology (SMT) is a method to mount components directly onto printed circuit boards (PCBs) and is widely used in low-cost and high-density electronic assemblies. Pick-and-place (P&P) is a core procedure for component placing after the solder paste printing (SPP) process in SMT. Generally, the industry uses an automated optical inspection (AOI) machine to detect defects after the components are mounted. However, the AOI machine cannot discern the failures’ root causes and offer reliable P&P machine maintenance references. With the advent of Industry 4.0, machine learning (ML) methods can be applied to improve production line maintenance. Therefore, the traditional check-up process can be changed into a data-driven, predictive, and condition-based maintenance process. Production efficiency can be significantly increased. In this article, a multioutput classification-based defect diagnosis (MCDD) model has been developed to trace the root causes of defects by using the patterns discovered from the experiment data. The experiments with initial machine errors are conducted and investigation information is collected. Compared with the traditional root cause identification model, the developed model is easier to adjust and can achieve an overall classification accuracy of 84.5%. Furthermore, the transfer learning method has been used to apply the trained model for one component to other components and can achieve an accuracy of 81.74%.

IEEE Transactions on Components Packaging and Manufacturing TechnologyVol. 15(4)
Binghamton University (US), Stockton University (US)
Openalex Percentile: Top 21%
Industrial Vision Systems and Defect Detection
1.24
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

An Integrated Multioutput Classification-Based Defect Diagnosis Model for Pick-and-Place Machines — Yuqiao Cen, Daehan Won, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology (2025) | TGRS Research Map | TGRS