Combinational Standard Cell Design using RHBD Technique

In modern digital integrated circuit (IC)design, reliability and performance are critical factors, especially for systems that operate in harsh environments. Combinational logic circuits, integral to many digital systems, are vulnerable to reliability issues, such as radiation-induced failures,which can result in malfunctioning of the device. To address the3se concerns,the Radiation-Hardened-by-Design(RHBD)technique has attracted considerable intrest for improving the radiation tolerance of circuits without requiring additional shielding or expensive processes. This paper presents an innovative approach to combinational standard cell design by incorporating RHBD techniques. The proposed method involves utilizing fault-tolerant design principles such as error correction, redundancy, and optimization of logicg at estomitigate the effect so fradiation.The study discusses the selection of appropriate standard cells, the adaptation of combinational logic circuits, and the evaluation of their radiation tolerance. Simulation results demonstrate that the proposed RHBD combinational cells achieve enhanced fault immunity while maintaining area and power efficiency