SAP: Corrective Machine Unlearning with Scaled Activation Projection for Label Noise Robustness

Label corruption, where training samples are mislabeled due to non-expert annotation or adversarial attacks, significantly degrades model performance. Acquiring large, perfectly labeled datasets is costly, and retraining models from scratch is computationally expensive. To address this, we introduce Scaled Activation Projection (SAP), a novel SVD (Singular Value Decomposition)-based corrective machine unlearning algorithm. SAP mitigates label noise by identifying a small subset of trusted samples using cross-entropy loss and projecting model weights onto a clean activation space estimated using SVD on these trusted samples. This process suppresses the noise introduced in activations due to the mislabeled samples. In our experiments, we demonstrate SAP’s effectiveness on synthetic noise with different settings and real-world label noise. SAP applied to the CIFAR dataset with 25% synthetic corruption show upto 6% generalization improvements. Additionally, SAP can improve the generalization over noise robust training approaches on CIFAR dataset by ∼ 3.2% on average. Further, we observe generalization improvements of 2.31% for a Vision Transformer model trained on naturally corrupted Clothing1M.

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Publication Details

Journal
Proceedings of the AAAI Conference on Artificial Intelligence
Published
2025-04-11
DOI
https://doi.org/10.1609/aaai.v39i17.33972
Citations
2
Primary Topic
Fault Detection and Control Systems
Type
article
Field-Weighted Citation Impact
4.33

Funders

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article

SAP: Corrective Machine Unlearning with Scaled Activation Projection for Label Noise Robustness

Kaushik Roy, Sangamesh Kodge, Gobinda Saha, Deepak Ravikumar
2 citations
Proceedings of the AAAI Conference on Artificial Intelligence
Fault Detection and Control Systems
4.33
article

SAP: Corrective Machine Unlearning with Scaled Activation Projection for Label Noise Robustness

Kaushik Roy, Sangamesh Kodge, Gobinda Saha, Deepak Ravikumar
article en
2 citations

Abstract

Label corruption, where training samples are mislabeled due to non-expert annotation or adversarial attacks, significantly degrades model performance. Acquiring large, perfectly labeled datasets is costly, and retraining models from scratch is computationally expensive. To address this, we introduce Scaled Activation Projection (SAP), a novel SVD (Singular Value Decomposition)-based corrective machine unlearning algorithm. SAP mitigates label noise by identifying a small subset of trusted samples using cross-entropy loss and projecting model weights onto a clean activation space estimated using SVD on these trusted samples. This process suppresses the noise introduced in activations due to the mislabeled samples. In our experiments, we demonstrate SAP’s effectiveness on synthetic noise with different settings and real-world label noise. SAP applied to the CIFAR dataset with 25% synthetic corruption show upto 6% generalization improvements. Additionally, SAP can improve the generalization over noise robust training approaches on CIFAR dataset by ∼ 3.2% on average. Further, we observe generalization improvements of 2.31% for a Vision Transformer model trained on naturally corrupted Clothing1M.

Proceedings of the AAAI Conference on Artificial IntelligenceVol. 39(17)
Purdue University West Lafayette (US)
National Science Foundation, Semiconductor Research Corporation, UTC Aerospace Systems
Openalex Percentile: Top 7%
Fault Detection and Control Systems
4.33
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SAP: Corrective Machine Unlearning with Scaled Activation Projection for Label Noise Robustness — Kaushik Roy, Sangamesh Kodge, et al. · Proceedings of the AAAI Conference on Artificial Intelligence (2025) | TGRS Research Map | TGRS