Some considerations on thick sample thickness in X-ray fluorescence analysis

In this work, the problem of the assessment of thickness for a thick sample in the case of polychromatic excitation has been considered. The complete iterative solution has been compared with the simplified approaches.

Authors

Funda Baran
Paweł Wróbel (ORCID: https://orcid.org/0000-0002-5445-6201)

Institutions

Jagiellonian University (PL)
AGH University of Krakow (PL)

Publication Details

Journal: Journal of Analytical Atomic Spectrometry
Published: 2025-01-01
DOI: https://doi.org/10.1039/d4ja00406j
Primary Topic: X-ray Spectroscopy and Fluorescence Analysis
Type: article
Field-Weighted Citation Impact: 0.00

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article

Some considerations on thick sample thickness in X-ray fluorescence analysis

Funda Baran, Paweł Wróbel

Jan 1, 2025

2 links

Journal of Analytical Atomic Spectrometry

X-ray Spectroscopy and Fluorescence Analysis

article

Some considerations on thick sample thickness in X-ray fluorescence analysis

Funda Baran, Paweł Wróbel

January 1, 2025article en

Abstract

Journal of Analytical Atomic SpectrometryVol. 40(5)

Jagiellonian University (PL), AGH University of Krakow (PL)

Openalex Percentile: Top 91%

X-ray Spectroscopy and Fluorescence Analysis

DOI Source OpenAlex

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