An ASIC for ToF-PET application with MCP-PMTs
Abstract The micro-channel plate photomultiplier tube (MCP-PMT) demonstrates excellent sensitivity to single photoelectrons, with a rise time of less than 100 ps. It offers an exceptionally low transit time spread, around 10 ps for multi-photoelectrons and under 50 ps for single photoelectrons. This performance has the potential to enhance coincidence timing, improving image quality in positron emission tomography (PET) and advancing next-generation physics experiments. To meet the stringent demands of picosecond-level time resolution, we developed a prototype frond-end circuit, the FPMROC, designed to accurately measure the time of arrival from the MCP-PMT with a gain of 10 5 . For a target coincidence time resolution of 100 ps, the MCP-PMT contribution is limited to approximately 30 ps, requiring the FPMROC jitter to remain below 10 ps. The FPMROC is implemented using a 55 nm CMOS process and integrates 8 readout channels, a data builder, a high-speed serializer, periphery, and test circuits. Each channel comprises a low-noise preamplifier, discriminator, and time-to-digital converter (TDC) for both time of arrival and time-over-threshold measurements. Digital-to-analog converters, a phase-locked loop, and an serial peripheral interface are used for calibration and threshold adjustment, providing low jitter clocks, and slow control, respectively. Additionally, a charge injection circuit is incorporated for testing and calibration. A prototype design was submitted in July 2024, and the following sections present the architecture, key circuits and simulation results.
Authors
- Chenghui Xia (ORCID: https://orcid.org/0000-0001-5087-8805)
- L. Zhang (ORCID: https://orcid.org/0009-0001-5808-7976)
- Rundong Wan (ORCID: https://orcid.org/0000-0003-1933-4265)
- W. Zhang
- J. Ye (ORCID: https://orcid.org/0000-0001-9274-707X)
- Bowen Deng (ORCID: https://orcid.org/0000-0003-1447-842X)
- Wenxin Dai (ORCID: https://orcid.org/0000-0002-7857-6072)
- Yinquan Yuan (ORCID: https://orcid.org/0000-0001-7601-8440)
- Xiongbo Yan (ORCID: https://orcid.org/0000-0002-5402-7327)
- Zhifan Zhou (ORCID: https://orcid.org/0000-0001-6323-6756)
- Jie Wang (ORCID: https://orcid.org/0000-0001-9196-1285)
- C. Wang (ORCID: https://orcid.org/0009-0002-4873-9253)
- D. Guo (ORCID: https://orcid.org/0000-0002-1862-7149)
- Lulu Xiao
- Gong Zhang (ORCID: https://orcid.org/0009-0004-4197-2508)
- Junyi Huang (ORCID: https://orcid.org/0009-0002-8240-422X)
- Xiaoting Li (ORCID: https://orcid.org/0000-0003-3893-8195)
Institutions
- Hankou University (CN)
- Central China Normal University (CN)
- Wuhan Textile University (CN)
- Hubei Polytechnic University (CN)
- Institute of High Energy Physics (AT)
- Institute of High Energy Physics (CN)
- State Key Laboratory of Chemical Engineering (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Journal of Instrumentation
- Published
- 2025-04-01
- DOI
- https://doi.org/10.1088/1748-0221/20/04/c04024
- Citations
- 1
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.73