Development of portable nanofocusing optics for X-ray free-electron laser pulses

We present the development of a portable and compact nanofocusing system utilizing Kirkpatrick-Baez optics for X-ray free-electron lasers (XFELs). The system has a total length of merely 340 mm from the initial elliptical mirror to the focal point. With this setup, we achieve focusing capabilities reaching dimensions as small as 150 nm horizontally and 220 nm vertically, resulting in an intense beam with an intensity of 2.5 × 10<sup>19</sup> W cm<sup>-2</sup> for a 10 keV XFEL with a pulse energy of 110 µJ. As a demonstration of its applicability in X-ray nonlinear optics, we successfully observed an 8.64 keV Zn Kα laser by irradiating a Zn foil with the focused XFEL beam. The attained photon energy is currently the highest photon energy for amplified spontaneous emission via bound-bound transitions of electrons in the world. We anticipate that this portable and compact nanofocusing system will pave the way for new frontiers in X-ray nonlinear optics and high-energy density science, owing to its adaptability to various experimental conditions.

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Publication Details

Journal
Journal of Synchrotron Radiation
Published
2025-04-09
DOI
https://doi.org/10.1107/s1600577525002279
Citations
1
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
1.88

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Development of portable nanofocusing optics for X-ray free-electron laser pulses

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Journal of Synchrotron Radiation
Advanced X-ray Imaging Techniques
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Development of portable nanofocusing optics for X-ray free-electron laser pulses

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article en
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Abstract

We present the development of a portable and compact nanofocusing system utilizing Kirkpatrick-Baez optics for X-ray free-electron lasers (XFELs). The system has a total length of merely 340 mm from the initial elliptical mirror to the focal point. With this setup, we achieve focusing capabilities reaching dimensions as small as 150 nm horizontally and 220 nm vertically, resulting in an intense beam with an intensity of 2.5 × 10<sup>19</sup> W cm<sup>-2</sup> for a 10 keV XFEL with a pulse energy of 110 µJ. As a demonstration of its applicability in X-ray nonlinear optics, we successfully observed an 8.64 keV Zn Kα laser by irradiating a Zn foil with the focused XFEL beam. The attained photon energy is currently the highest photon energy for amplified spontaneous emission via bound-bound transitions of electrons in the world. We anticipate that this portable and compact nanofocusing system will pave the way for new frontiers in X-ray nonlinear optics and high-energy density science, owing to its adaptability to various experimental conditions.

Journal of Synchrotron RadiationVol. 32(3)
SPring-8 (JP), Japan Synchrotron Radiation Research Institute (JP)
Japan Society for the Promotion of Science
Affordable and clean energy
Openalex Percentile: Top 18%
Advanced X-ray Imaging Techniques
1.88
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