Temperature Dependent Dark Conductivity: Insights into Defect Levels in ln<sub>2</sub>S<sub>3</sub> and Graphene-doped ln<sub>2</sub>S<sub>3</sub> Thin Films
Abstract Indium sulphide is a promising candidate for optoelectronic and solar cell applications. This study employs a cost-effective, indigenously developed setup to analyse defect levels in In 2 S 3 and graphene-doped In 2 S 3 thin films, which are key determinants of their electronic properties. In 2 S 3 was deposited using Chemical Bath Deposition (CBD), and graphene was incorporated into the thin films through a two-step process involving spin coating followed by annealing. Shallow defect levels at 33 meV, associated with indium interstitials, were detected, which contribute to the n-type behaviour of In 2 S 3 . Defect levels in the range of 12-25 meV were similar to those in chlorine-doped In 2 S 3 , while a deeper defect level at 52.75 meV, which is absent in pristine In 2 S 3 , plays a key role in the superior properties of the graphene-doped In 2 S 3 films, suggesting its potential for advanced optoelectronic applications.
Authors
- T. H. Sajeesh
- C.K. Sumesh (ORCID: https://orcid.org/0000-0001-6035-9312)
- N J Raysa
- K S Priyanka Laslet
Institutions
- General Hospital Ernakulam (IN)
Publication Details
- Journal
- Journal of Physics Conference Series
- Published
- 2025-04-01
- DOI
- https://doi.org/10.1088/1742-6596/2995/1/012004
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00