DDP-Fsim: Efficient and Scalable Fault Simulation for Deterministic Patterns with Two-Dimensional Parallelism

Fault simulation is a fundamental component in the design for testability (DFT) processes, especially in automatic test pattern generation (ATPG). Various approaches have been proposed to enhance the efficiency of fault simulation on multi-core systems. However, these approaches have not taken full consideration of the intrinsic characteristics of deterministic patterns. Deterministic patterns are generated by ATPG and are predominantly employed in practical applications rather than random patterns. In this paper, we introduce DDP-Fsim, a fast and scalable fault simulator on multi-core systems. DDP-Fsim capitalizes on the distinctive nature of deterministic patterns, wherein a small subset of patterns can effectively detect the majority of faults. Initially, DDP-Fsim parallels in fault dimension by dynamically scheduling fanout-free regions (FFR) to handle easy-to-detect faults. Subsequently, it parallels in pattern dimension by dynamically scheduling patterns to address the remaining hard-to-detect faults. Experiments demonstrate that on a 24-core system, DDP-Fsim is 10× faster than the commercial tools for full-scan circuits and deterministic patterns. Additionally, DDP-Fsim with 24 cores achieves an average speed-up of 16× compared to its single-core execution, while the commercial tools with 24 cores achieves only 3×-6× speed-up than their single-core execution. This indicates the significantly superior scalability for DDP-Fsim.