Multi-Tier 3D SRAM Module Design: Targeting Bit-Line and Word-Line Folding
This study presents a novel approach to address the challenges of scaling limitations and high read/write latencies inherent in conventional 2D SRAM designs through the development of a 15nm FinFET-based standalone 3D SRAM Array. Utilizing Monolithic Intertier Vias, our two-tiered implementation effectively mitigates these limitations along both X and Y axes. We introduce two distinct design methodologies for 3D SRAM arrays - Wordline and Bitline folding. Through post-layout simulations conducted on arrays with capacities of 2kB (256WLx64BL) and 8kB (512WLx128BL), our 3D designs exhibit superior performance metrics. Notably, the 3D Wordline-Folded design achieves a remarkable 57.54% average reduction in footprint compared to the 2D baseline across both array sizes. Furthermore, the 3D Bitline-Folded configuration demonstrates consistent superiority in speed, with an average read latency improvement of 17.16% and a notable 54.2% enhancement in write latency. Conversely, the 3D Wordline-Folded array emerges as the most energy-efficient option, boasting an average reduction of 15.3% in read energy and over 21% in write energy compared to the 2D baseline.
Authors
- Saibal Mukhopadhyay (ORCID: https://orcid.org/0000-0002-8894-3390)
- Sung Kyu Lim (ORCID: https://orcid.org/0000-0002-2267-5282)
- Daehyun Kim (ORCID: https://orcid.org/0000-0002-5582-3579)
- Aditya Iyer (ORCID: https://orcid.org/0009-0002-6700-1676)
Institutions
- Georgia Institute of Technology (US)
Publication Details
- Published
- 2024-10-27
- DOI
- https://doi.org/10.1145/3676536.3676810
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation
- Semiconductor Research Corporation