Deep learning assisted high‐resolution microscopy image processing for phase segmentation in functional composite materials
In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilisation of deep learning methodologies for image analysis has attracted considerable interest in recent years, with multiple investigations employing such techniques for image segmentation and analysis within the realm of battery research. However, the automated analysis of high-resolution microscopy images for detecting phases and components in composite materials is still an underexplored area. This work proposes a novel workflow for FFT-based segmentation, periodic component detection and phase segmentation from raw high-resolution Transmission Electron Microscopy (TEM) images using a trained U-Net segmentation model. The developed model can expedite the detection of components and their phase segmentation, diminishing the temporal and cognitive demands associated with scrutinising an extensive array of TEM images, thereby mitigating the potential for human errors. This approach presents a novel and efficient image analysis approach with broad applicability beyond the battery field and holds potential for application in other related domains characterised by phase and composition distribution, such as alloy production.
Authors
- Shuang Bai (ORCID: https://orcid.org/0000-0002-2906-6738)
- William Wu
- Ganesh Raghavendran (ORCID: https://orcid.org/0000-0002-7194-4207)
- Bingyu Lu (ORCID: https://orcid.org/0000-0003-3475-4911)
- Ying Shirley Meng (ORCID: https://orcid.org/0000-0001-8936-8845)
- Bing Han (ORCID: https://orcid.org/0000-0002-6473-0438)
- Minghao Zhang (ORCID: https://orcid.org/0000-0002-3366-0465)
- Fortune Adekogbe
Institutions
- University of Lagos (NG)
- University of California System (US)
- University of California San Diego (US)
- University of Chicago (US)
Publication Details
- Journal
- Journal of Microscopy
- Published
- 2025-04-08
- DOI
- https://doi.org/10.1111/jmi.13413
- Primary Topic
- Machine Learning in Materials Science
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation
- Thermo Fisher Scientific
- Division of Electrical, Communications and Cyber Systems