Texture, Shape and Order Matter: A New Transformer Design for Sequential DeepFake Detection
Sequential DeepFake detection is an emerging task that predicts the manipulation sequence in order. Existing methods typically formulate it as an image-to-sequence problem, employing conventional Transformer architectures. However, these methods lack dedicated design and consequently result in limited performance. As such, this paper describes a new Transformer design, called TSOM, by exploring three perspectives: Texture, Shape, and Order of Manipulations. Our method features four major improvements: we describe a new texture-aware branch that effectively captures subtle manipulation traces with a Diversiform Pixel Difference Attention module. Then we introduce a Multi-source Cross-attention module to seek deep correlations among spatial and sequential features, enabling effective modeling of complex manipulation traces. To further enhance the cross-attention, we describe a Shape-guided Gaussian mapping strategy, providing initial priors of the manipulation shape. Finally, observing that the subsequent manipulation in a sequence may influence traces left in the preceding one, we intriguingly invert the prediction order from forward to backward, leading to notable gains as expected. Extensive experimental results demonstrate that our method outperforms others by a large margin, highlighting the superiority of our method.
Authors
- Junyu Dong (ORCID: https://orcid.org/0000-0001-7012-2087)
- Jiaran Zhou (ORCID: https://orcid.org/0000-0002-2943-2806)
- Yuezun Li (ORCID: https://orcid.org/0000-0001-9299-1945)
- Baoyuan Wu (ORCID: https://orcid.org/0000-0003-2183-5990)
- Yunfei Li (ORCID: https://orcid.org/0009-0007-2206-520X)
- Xin Wang (ORCID: https://orcid.org/0000-0003-2386-5405)
Institutions
- University at Albany, State University of New York (US)
- Chinese University of Hong Kong, Shenzhen (CN)
- Ocean University of China (CN)
Publication Details
- Published
- 2025-02-26
- DOI
- https://doi.org/10.1109/wacv61041.2025.00030
- Citations
- 2
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 2.48
Funders
- National Natural Science Foundation of China
- China Postdoctoral Science Foundation
- National Natural Science Foundation of China-Shandong Joint Fund