AnomalyDINO: Boosting Patch-based Few-Shot Anomaly Detection with DINOv2
Recent advances in multimodal foundation models have set new standards in few-shot anomaly detection. This paper explores whether high-quality visual features alone are sufficient to rival existing state-of-the-art vision-language models. We affirm this by adapting DINOv2 for oneshot and few-shot anomaly detection, with a focus on industrial applications. We show that this approach does not only rival existing techniques but can even outmatch them in many settings. Our proposed vision-only approach, AnomalyDINO, follows the well-established patchlevel deep nearest neighbor paradigm, and enables both image-level anomaly prediction and pixel-level anomaly segmentation. The approach is methodologically simple and training-free and, thus, does not require any additional data for fine-tuning or meta-learning. Despite its simplicity, AnomalyDINO achieves state-of-the-art results in oneand few-shot anomaly detection (e.g., pushing the one-shot performance on MVTec-AD from an AUROC of 93.1% to 96.6%). The reduced overhead, coupled with its outstanding few-shot performance, makes AnomalyDINO a strong candidate for fast deployment, e.g., in industrial contexts.
Authors
- Johannes Lederer (ORCID: https://orcid.org/0000-0002-5369-3053)
- Simon Damm (ORCID: https://orcid.org/0000-0002-4584-1765)
- Mike Laszkiewicz (ORCID: https://orcid.org/0009-0002-6741-2432)
- Asja Fischer (ORCID: https://orcid.org/0000-0002-1916-7033)
Institutions
- Universität Hamburg (DE)
- Ruhr University Bochum (DE)
Publication Details
- Published
- 2025-02-26
- DOI
- https://doi.org/10.1109/wacv61041.2025.00136
- Citations
- 21
- Primary Topic
- Anomaly Detection Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 52.10