An improved protocol for LA-MC-ICP-MS isotope ratio measurements of natural silicon at 213 nm: comparison of mass bias correction factor dependence (solution <i>vs.</i> solid single crystal) and solid sample homogeneity
Mass bias correction K factors for Si isotope ratios obtained from a solid silicon sample (background) using laser ablation compared to K factors derived from a solution of the same sample material. K factors derived by both methods agree well.
Authors
- Axel Pramann (ORCID: https://orcid.org/0000-0003-1621-0339)
- Olaf Rienitz (ORCID: https://orcid.org/0000-0002-5087-5812)
- Tao Gao (ORCID: https://orcid.org/0000-0002-4065-3802)
- Tongxiang Ren (ORCID: https://orcid.org/0000-0002-0813-8990)
Institutions
- Physikalisch-Technische Bundesanstalt (DE)
- National Institute of Metrology (CN)
Publication Details
- Journal
- Journal of Analytical Atomic Spectrometry
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d5ja00015g
- Citations
- 1
- Primary Topic
- Silicon Effects in Agriculture
- Type
- article
- Field-Weighted Citation Impact
- 1.75