Comprehensive digital image analysis to detect manipulation
Comprehensive digital image analysis plays an important role in modern digital forensics and cybersecurity, as it allows detecting fakes, tampering and hidden traces of editing in photographs or other visual data. These methods can be used by OSINT (Open Source Intelligence) specialists and investigative journalists to detect fakes and counter-propaganda. This article describes a scientific and methodological approach aimed at detecting manipulations in digital images based on a combination of various algorithms and data processing technologies. The article considers contour and gradient analysis (Kenny's method), detection of editing traces through metadata analysis (EXIF), Error Level Analysis (ELA), as well as spectral and wavelet analysis. Based on a systematic review of the results of applying these methods to a sample of different types of images, it is demonstrated that comprehensive analysis has significant advantages over the use of individual methods, as it allows for the fullest possible identification of potential traces of manipulation, including copying and pasting of fragments, digital artefacts from excessive compression, and inconsistencies in the internal structures of images. The article contains a description of the methodology, including the necessary mathematical models, which allows us to generalise and formalise the analysis procedure. The results of the study confirm the high accuracy and reliability of the proposed approach. Recommendations for the practical use of complex digital image analysis in the fields of forensic science, media, cyberattack investigations and intellectual property protection are proposed, and promising areas for further research in this area are outlined
Authors
- Dmytro Prokopovych-Tkachenko (ORCID: https://orcid.org/0000-0002-6590-3898)
- V. M. Dreshpak (ORCID: https://orcid.org/0000-0001-9802-3769)
- Lyudmila Rybalchenko (ORCID: https://orcid.org/0000-0003-0413-8296)
Publication Details
- Journal
- Artificial Intelligence
- Published
- 2025-03-30
- DOI
- https://doi.org/10.15407/jai2025.01.077
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00