Offset-Tolerant Body-Biased Sense Amplifier With Rise-Time Control Technique for SRAM

In this paper, we propose an Offset-Tolerant Bodybiased sense amplifier (OTB-SA) with a rise-time (TRISE) control technique to address the sensing failure issue that occurs when the input voltage difference (DVBL) of a latch-type SA is smaller than the offset voltage (VOS). The OTB-SA with TRISE leverages body biasing and TRISE control to enhance the differential signal injection (DSI) effect, thereby reducing both VOS and energy consumption. Post-layout HSPICE simulation results using a 28 nm technology model indicate that, when target VOS standard deviation (sOS) is 5 mV, the OTB-SA with TRISE achieves a 49.6 reduction in area and a 60.1% decrease in energy consumption compared to a voltage-latched SA (VLSA) without TRISE. Moreover, compared to previous SAs, the OTB-SA with TRISE showed up to 69.1% area reduction and up to 91.2% energy consumption reduction. Measurements from a 28 nm test chip confirmed that TRISE control is effective, showing a trend where sOS decreases as TRISE increases for OTB-SA.

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Publication Details

Journal
IEEE Transactions on Circuits & Systems II Express Briefs
Published
2025-04-07
DOI
https://doi.org/10.1109/tcsii.2025.3558562
Citations
1
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
0.73

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article

Offset-Tolerant Body-Biased Sense Amplifier With Rise-Time Control Technique for SRAM

Bayartulga Ishdorj, Meng Han, Jaehwan Kim, Taehui Na
1 citations
IEEE Transactions on Circuits & Systems II Express Briefs
Advancements in Semiconductor Devices and Circuit Design
0.73
article

Offset-Tolerant Body-Biased Sense Amplifier With Rise-Time Control Technique for SRAM

Bayartulga Ishdorj, Meng Han, Jaehwan Kim, Taehui Na
article en
1 citations

Abstract

In this paper, we propose an Offset-Tolerant Bodybiased sense amplifier (OTB-SA) with a rise-time (TRISE) control technique to address the sensing failure issue that occurs when the input voltage difference (DVBL) of a latch-type SA is smaller than the offset voltage (VOS). The OTB-SA with TRISE leverages body biasing and TRISE control to enhance the differential signal injection (DSI) effect, thereby reducing both VOS and energy consumption. Post-layout HSPICE simulation results using a 28 nm technology model indicate that, when target VOS standard deviation (sOS) is 5 mV, the OTB-SA with TRISE achieves a 49.6 reduction in area and a 60.1% decrease in energy consumption compared to a voltage-latched SA (VLSA) without TRISE. Moreover, compared to previous SAs, the OTB-SA with TRISE showed up to 69.1% area reduction and up to 91.2% energy consumption reduction. Measurements from a 28 nm test chip confirmed that TRISE control is effective, showing a trend where sOS decreases as TRISE increases for OTB-SA.

IEEE Transactions on Circuits & Systems II Express BriefsVol. 72(5)
Incheon National University (KR)
National Research Foundation of Korea
Openalex Percentile: Top 30%
Advancements in Semiconductor Devices and Circuit Design
0.73
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