Analysis of an Efficient Fault Tolerant Linear Feedback Shift Register for Low Power Applications

Traditional fault-tolerant Linear Feedback Shift Registers have historically been plagued by a significant vulnerability: numerous Single-Point-of-Failures (SPoFs), where a single fault could potentially compromise the entire system's functionality. Recognizing this critical limitation, researchers have developed an innovative solution called the Fault Tolerant-Linear Feedback Shift Register (FT-LFSR), which dramatically reduces the number of potential failure points. This breakthrough approach leverages a modified version of Triple Modular Redundancy (TMR), a well-established fault tolerance technique based on spatial redundancy.

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Publication Details

Journal
International Journal on Science and Technology
Published
2025-04-04
DOI
https://doi.org/10.71097/ijsat.v16.i2.3063
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
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article

Analysis of an Efficient Fault Tolerant Linear Feedback Shift Register for Low Power Applications

Om Prakash Kumar, Navali Mohammed Sufiyan -, Pentakota Siddhu -
International Journal on Science and Technology
Radiation Effects in Electronics
article

Analysis of an Efficient Fault Tolerant Linear Feedback Shift Register for Low Power Applications

Om Prakash Kumar, Navali Mohammed Sufiyan -, Pentakota Siddhu -
article en

Abstract

Traditional fault-tolerant Linear Feedback Shift Registers have historically been plagued by a significant vulnerability: numerous Single-Point-of-Failures (SPoFs), where a single fault could potentially compromise the entire system's functionality. Recognizing this critical limitation, researchers have developed an innovative solution called the Fault Tolerant-Linear Feedback Shift Register (FT-LFSR), which dramatically reduces the number of potential failure points. This breakthrough approach leverages a modified version of Triple Modular Redundancy (TMR), a well-established fault tolerance technique based on spatial redundancy.

International Journal on Science and TechnologyVol. 16(2)
Openalex Percentile: Top 95%
Radiation Effects in Electronics
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