Quantifying the orientation dependence of diffraction contrast on magnetic STEM-DPC imaging of freestanding oxide thin films

Scanning Transmission Electron Microscopy - Differential Phase Contrast (STEM-DPC) is a 4D-STEM technique that allows quantitative characterization of electromagnetic fields down to nanoscale resolution. However, a significant challenge arises from diffractive intensity scattering in crystalline materials, which introduces distortive contrast that can obscure magnetic imaging. This work details how to minimize this issue, which the authors demonstrate using a ferromagnetic freestanding La${}_{0.67}$Sr${}_{0.33}$MnO${}_{3}$ thin film to quantify diffraction contrast variations under different orientations and processing conditions. All the data and scripts are made publicly available, providing a platform for others to test their own processing.