YOLOv11-BSS: Damaged Region Recognition Based on Spatial and Channel Synergistic Attention and Bi-Deformable Convolution in Sanding Scenarios
In order to address the problem that the paint surface of the damaged region of the body is similar to the color texture characteristics of the usual paint surface, which leads to the phenomenon of leakage or misdetection in the detection process, an algorithm for detecting the damaged region of the body based on the improved YOLOv11 is proposed. Firstly, bi-deformable convolution is proposed to optimize the convolution kernel shape offset direction, which effectively improves the feature representation power of the backbone network; secondly, the C2PSA-SCSA module is designed to construct the coupling between spatial attention and channel attention, which enhances the perceptual power of the backbone network, and makes the model pay better attention to the damaged region features. Then, based on the GSConv module and the DWConv module, we build the slim-neck feature fusion network based on the GSConv module and DWConv module, which effectively fuses local features and global features to improve the saturation of semantic features; finally, the Focaler-CIoU border loss function is designed, which makes use of the principle of Focaler-IoU segmented linear mapping, adjusts the border loss function’s attention to different samples, and improves the model’s convergence of feature learning at various scales. The experimental results show that the enhanced YOLOv11-BSS network improves the precision rate by 7.9%, the recall rate by 1.4%, and the mAP@50 by 3.7% over the baseline network, which effectively reduces the leakage and misdetection of the damaged areas of the car body.
Authors
- Ying Pan (ORCID: https://orcid.org/0009-0008-8880-9758)
- Yinjiang Li
- Zhifeng Zhou (ORCID: https://orcid.org/0000-0002-7578-815X)
Institutions
- Shanghai University of Engineering Science (CN)
Publication Details
- Journal
- Electronics
- Published
- 2025-04-05
- DOI
- https://doi.org/10.3390/electronics14071469
- Citations
- 3
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 3.73