RPFF-PA : Reliable and Parallel Fault-tolerant Framework for Path Latency Reduction Deployed in Register Arrays
Soft errors can lead to electronic device failures caused by radiation events. Therefore, fault-tolerant designs are essential for safeguarding critical memory components and processors. The N-modular redundancy (NMR) scheme presents a practical means of implementing register protection. However, the NMR fault-tolerant scheme is serially configured on the critical path, increasing path latency of approximately 12.4 \(\% \) -35.5 \(\% \) . In this paper, we propose a parallel fault-tolerant framework for register arrays(RPFF-PA), which realizes the parallelized execution of hardern processes and read/write operations. By executing the decoding process in parallel with the decision circuit, the latency cost caused by fault-tolerant components is significantly reduced. The results demonstrate that the strategy reduces path latency by 5.2 \(\% \) -20.3 \(\% \) compared to the original NMR approach. Furthermore, the framework includes a real-time error correction module capable of effectively addressing the error accumulation issue, thereby enhancing the reliability of the fault-tolerant system.
Authors
- Mengfei Yang (ORCID: https://orcid.org/0000-0002-6844-1246)
- Jiawei Nian (ORCID: https://orcid.org/0000-0002-9693-3467)
- Long Cheng (ORCID: https://orcid.org/0000-0003-1638-059X)
- Xingtang Wu (ORCID: https://orcid.org/0000-0002-3444-0026)
- Fang Fang (ORCID: https://orcid.org/0000-0003-3784-3696)
- Xin Gao (ORCID: https://orcid.org/0009-0001-4168-175X)
- Hongjin Liu (ORCID: https://orcid.org/0000-0003-2189-3592)
Institutions
- North China Electric Power University (CN)
- China Academy of Space Technology (CN)
- State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources
Publication Details
- Journal
- ACM Transactions on Embedded Computing Systems
- Published
- 2025-04-07
- DOI
- https://doi.org/10.1145/3728471
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00