Analysis of Parameters of Metal Film Resistors Used in Instrument Engineering
Purpose search and selection of metal film resistors of large commercial companies; determination of parameters of resistors significant for instrument engineering; study of existing literature data on methods of evaluation of such parameters; calculation of attractiveness indicators of metal film resistors of each manufacturer for each selected parameter, calculation of a complex indicator of attractiveness, analysis of the obtained results. The aim of the work is to provide the results of a comparative analysis of resistors of three commercial companies by the following parameters: cost, resistance rating, dimensional error, voltage coefficient and temperature coefficient of resistance. Methods used: comparison of resistors by summing up the ranked indicators. Novelty: an element of novelty of the presented study is the analysis of dimensional parameters and voltage coefficient. Result: YUANQI ELECTRONIC resistors have the highest general attractiveness index. They are the most optimal choice for instrumentation of all the selected models, and also have the best resistance rating error, dimensional error, and temperature coefficient of resistance. FXI Electronics Corporation resistors have a lower general attractiveness index, but have an advantage in the voltage coefficient. These resistors should be used in power electronics devices. The power of which can vary widely, and thus have a different effect on the resistivity of metal films. WEIDILY resistors have an advantage in cost. Theoretical / Practical significance: The presented comparison is proposed to be used when choosing a manufacturer of metal film resistors for instrumentation. Also, the calculated general attractiveness indices will allow you to make decisions about purchasing the resistors selected for the study, comparing with other resistor manufacturers, conducting your own research, improving the quality of metal film resistors and identifying weaknesses.
Authors
- V. A. Kim
- Semyon Sergeevich Ogluzdin
- Andrey Anatolyevich Pogorelov
Publication Details
- Journal
- Telecom IT
- Published
- 2024-12-23
- DOI
- https://doi.org/10.31854/2307-1303-2024-12-2-48-61
- Primary Topic
- Advanced Sensor Technologies Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00