Exploring high-energy X-ray phase-contrast microscopy at a diffraction-limited storage ring

High-energy X-ray microscopy is critical for imaging dense and large-scale materials due to its ability to provide deep penetration and reduced radiation damage. Incorporating phase-contrast imaging enables the visualization of subtle differences in density that traditional absorption techniques cannot detect. Despite these benefits, implementing phase-contrast imaging at high energies ( > 70 keV ) presents significant challenges. The short wavelength of high-energy X-rays reduces spatial coherence and diminishes refraction, thereby limiting phase-contrast effects. The flux of emitted X-ray photons significantly drops at higher energies due to less efficient emission process. All of these challenges degrade X-ray phase-contrast image quality. In this study, we evaluate the feasibility of high-energy X-ray phase-contrast imaging (XPCI) using propagation-based methods. Through rigorous wave propagation simulations, we explored the effects and importance of optimizing the source size and geometrical configurations to enhance image quality. Under optimized conditions at a fourth-generation storage ring, we successfully retrieved phase information of microstructures surrounded by similar materials, such as boron fibers in an aluminum matrix and dual-phase iron. These results provide valuable guidelines for designing high-energy X-ray microscopy experiments, helping to maximize imaging performance while addressing the inherent limitations of using high-energy for XPCI. Ultimately, this study provides essential insights for improving high-energy X-ray microscopy, paving the way for advancing non-destructive testing techniques for a wide range of challenging materials and applications. • Single-distance phase-contrast imaging validated for low coherence in propagation-based setup. • Enhanced phase-contrast at high energies through optimized source and geometry. • Feasibility of high-energy X-ray imaging for low-contrast materials with noise simulation.