Motion stage precision prediction for photonic integrated circuit assembly

Abstract The consistently growing demand for robust automated Photonic Integrated Circuits assembly, testing and packaging, is increasingly oriented towards high volume and continuously sets newer challenges to overcome concerning throughput and cost effectiveness. Production processes’ intrinsic complexity, combined with short product life cycle and the necessity of quickly ramping up those to high volume, requires smarter solutions to guarantee high yield as well as low cycle time. Robust production demands for motion systems capable to realize repeated movements with precision and resolution in the range of tens of nanometers. These constraints on precision do not allow to operate the system at its highest overall speed; ideal working conditions are thereby preserved by slowing down motion, ending up trading cycle time for precision. Finally, the optimal trade-off between motion speed and repeatability is also expected to depend on hardware conditions and its optimization is therefore impossible without scheduling downtime and performing long evaluation processes. In this paper it is presented a solution for predicting linear stages’ motion inaccuracies from controller features by means of Machine Learning and Deep Learning modeling. The proposed formulation introduces a metric for calculating motion analytical imprecision that includes only the difference between successive position measurements, thus allowing a separation of short term repeatability from other error terms by removing the mean from the evaluation. Successive differences are interpreted as single-motions’ expected errors that can be aggregated into a repeatability estimate, serving as target distribution for the learning problem; predictions of single-motion metrics ensure the proposed approach to work in production scenarios when non identical movements are performed, opening up the possibility to realize advanced control paradigms and predictive maintenance for smart manufacturing.

Authors

Institutions

Publication Details

Journal
Journal of Intelligent Manufacturing
Published
2025-04-03
DOI
https://doi.org/10.1007/s10845-024-02539-4
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Motion stage precision prediction for photonic integrated circuit assembly

Christian Napoli, Colin Dankwart, Lorenzo Mandelli
Journal of Intelligent Manufacturing
Integrated Circuits and Semiconductor Failure Analysis
article

Motion stage precision prediction for photonic integrated circuit assembly

Christian Napoli, Colin Dankwart, Lorenzo Mandelli
article en

Abstract

Abstract The consistently growing demand for robust automated Photonic Integrated Circuits assembly, testing and packaging, is increasingly oriented towards high volume and continuously sets newer challenges to overcome concerning throughput and cost effectiveness. Production processes’ intrinsic complexity, combined with short product life cycle and the necessity of quickly ramping up those to high volume, requires smarter solutions to guarantee high yield as well as low cycle time. Robust production demands for motion systems capable to realize repeated movements with precision and resolution in the range of tens of nanometers. These constraints on precision do not allow to operate the system at its highest overall speed; ideal working conditions are thereby preserved by slowing down motion, ending up trading cycle time for precision. Finally, the optimal trade-off between motion speed and repeatability is also expected to depend on hardware conditions and its optimization is therefore impossible without scheduling downtime and performing long evaluation processes. In this paper it is presented a solution for predicting linear stages’ motion inaccuracies from controller features by means of Machine Learning and Deep Learning modeling. The proposed formulation introduces a metric for calculating motion analytical imprecision that includes only the difference between successive position measurements, thus allowing a separation of short term repeatability from other error terms by removing the mean from the evaluation. Successive differences are interpreted as single-motions’ expected errors that can be aggregated into a repeatability estimate, serving as target distribution for the learning problem; predictions of single-motion metrics ensure the proposed approach to work in production scenarios when non identical movements are performed, opening up the possibility to realize advanced control paradigms and predictive maintenance for smart manufacturing.

Journal of Intelligent ManufacturingVol. 37(1)
Częstochowa University of Technology (PL), Simcon kunststofftechnische Software (Germany) (DE), Sapienza University of Rome (IT)
Openalex Percentile: Top 95%
Integrated Circuits and Semiconductor Failure Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.