The effect of ionic radius carbon dot on Ti<sup>4+</sup> in lattice parameters of Ba<sub>0.2</sub>Sr<sub>0.8</sub>TiO<sub>3</sub> thin films

Barium Strontium Titanate (Ba₀.₂Sr₀.₈TiO₃) thin films doped with carbon dots at varying concentrations (0%, 2%, 4%, and 6%) were successfully synthesized using the Chemical Solution Deposition (CSD) method. The films were deposited on p-type (100) silicon substrates via spin coating at 8000 rpm, followed by annealing at 850 °C for 8 hours. Structural characterization using X-ray Diffraction (XRD) confirmed a cubic lattice structure for all samples, with lattice parameters (a = b = c) measured as 3.306 Å, 3.324 Å, 3.336 Å, and 3.311 Å for the 0%, 2%, 4%, and 6% doping levels. The observed increase in lattice parameters with higher carbon dot concentrations is attributed to the larger ionic radius of carbon dots (10 Å) compared to Ti⁴⁺ (0.61 Å). These results indicate that carbon dot incorporation modulates the structural properties of Ba₀.₂Sr₀.₈TiO₃ films, which could have significant implications for their functional applications.

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Publication Details

Journal
BIO Web of Conferences
Published
2025-01-01
DOI
https://doi.org/10.1051/bioconf/202517102008
Citations
2
Primary Topic
Ferroelectric and Piezoelectric Materials
Type
article
Field-Weighted Citation Impact
1.04
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article

The effect of ionic radius carbon dot on Ti4+ in lattice parameters of Ba0.2Sr0.8TiO3 thin films

Azlina Harun Kamaruddin, Irzaman Irzaman, Wahyu Dian Laksanawati, Aep Setiawan et al.
2 citations
BIO Web of Conferences
Ferroelectric and Piezoelectric Materials
1.04
article

The effect of ionic radius carbon dot on Ti4+ in lattice parameters of Ba0.2Sr0.8TiO3 thin films

Azlina Harun Kamaruddin, Irzaman Irzaman, Wahyu Dian Laksanawati, Aep Setiawan, Noviyan Darmawan, Johan Iskandar, Ahmad Ripai
article en
2 citations

Abstract

Barium Strontium Titanate (Ba₀.₂Sr₀.₈TiO₃) thin films doped with carbon dots at varying concentrations (0%, 2%, 4%, and 6%) were successfully synthesized using the Chemical Solution Deposition (CSD) method. The films were deposited on p-type (100) silicon substrates via spin coating at 8000 rpm, followed by annealing at 850 °C for 8 hours. Structural characterization using X-ray Diffraction (XRD) confirmed a cubic lattice structure for all samples, with lattice parameters (a = b = c) measured as 3.306 Å, 3.324 Å, 3.336 Å, and 3.311 Å for the 0%, 2%, 4%, and 6% doping levels. The observed increase in lattice parameters with higher carbon dot concentrations is attributed to the larger ionic radius of carbon dots (10 Å) compared to Ti⁴⁺ (0.61 Å). These results indicate that carbon dot incorporation modulates the structural properties of Ba₀.₂Sr₀.₈TiO₃ films, which could have significant implications for their functional applications.

BIO Web of ConferencesVol. 171
Ming Chi University of Technology (TW), IPB University (ID), Universitas Muhammadiyah Prof Dr Hamka (ID), National Nuclear Energy Agency of Indonesia (ID), National Research and Innovation Agency (ID)
Openalex Percentile: Top 26%
Ferroelectric and Piezoelectric Materials
1.04
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