Experimental analysis of potential origin of p-type conductivity in LiGa5O8

Recently, LiGa5O8, with a bandgap of ∼5.4 eV, has been demonstrated as a p-type semiconductor, which can be used to form a pn junction with β-Ga2O3. However, the occurrence of the p-type conductivity remains undetermined. In this work, the influence of as-grown film compositions and post-growth annealing on the p-type conductivity were investigated. The results indicate that oxygen vacancies play an important role in achieving p-type conductivity, as films with lower oxygen content exhibit higher hole concentrations under Li-poor conditions. The impact of different annealing atmospheres was also studied, finding that argon annealing enhances hole conductivity without altering film composition, while oxygen annealing reduces p-conductivity. In addition, the uniformity of Li distribution in the films was confirmed via secondary ion mass spectrometry (SIMS) depth profiling. The effect of unintentional Cr impurity incorporation was probed via cathodoluminescence (CL), concluding that Cr impurity led to strong luminescence at 716 nm but did not show impact on p-type behavior. Results from this work provide a deeper understanding of the fundamental properties of LiGa5O8, paving the way for its integration into advanced power electronic devices.

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Publication Details

Journal
APL Materials
Published
2025-04-01
DOI
https://doi.org/10.1063/5.0248979
Citations
3
Primary Topic
Ga2O3 and related materials
Type
article
Field-Weighted Citation Impact
1.28

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article

Experimental analysis of potential origin of p-type conductivity in LiGa5O8

Hongping Zhao, Vijay Gopal Thirupakuzi Vangipuram, Kaitian Zhang
3 citations
APL Materials
Ga2O3 and related materials
1.28
article

Experimental analysis of potential origin of p-type conductivity in LiGa5O8

Hongping Zhao, Vijay Gopal Thirupakuzi Vangipuram, Kaitian Zhang
article en
3 citations

Abstract

Recently, LiGa5O8, with a bandgap of ∼5.4 eV, has been demonstrated as a p-type semiconductor, which can be used to form a pn junction with β-Ga2O3. However, the occurrence of the p-type conductivity remains undetermined. In this work, the influence of as-grown film compositions and post-growth annealing on the p-type conductivity were investigated. The results indicate that oxygen vacancies play an important role in achieving p-type conductivity, as films with lower oxygen content exhibit higher hole concentrations under Li-poor conditions. The impact of different annealing atmospheres was also studied, finding that argon annealing enhances hole conductivity without altering film composition, while oxygen annealing reduces p-conductivity. In addition, the uniformity of Li distribution in the films was confirmed via secondary ion mass spectrometry (SIMS) depth profiling. The effect of unintentional Cr impurity incorporation was probed via cathodoluminescence (CL), concluding that Cr impurity led to strong luminescence at 716 nm but did not show impact on p-type behavior. Results from this work provide a deeper understanding of the fundamental properties of LiGa5O8, paving the way for its integration into advanced power electronic devices.

APL MaterialsVol. 13(4)
The Ohio State University (US)
Air Force Office of Scientific Research
Openalex Percentile: Top 21%
Ga2O3 and related materials
1.28
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