Analysis of Simplified Circuit Level Noise in T Gate Implementation

We study the effect of simplified circuit level noise, consisting of the introduction of depolarizing errors at the input of any quantum gate, in two different implementations of a physical T gate. Both implementations use a magic state and Clifford operations, but one of them utilizes an additional ancilla that allows the reutilization of the magic state in future quantum operations. We assess the degradation experienced by the implemented T gates (due to error propagation) compared with ideal T gates by obtaining, as a function of the depolarizing probability, closed-form expressions for the probability of the error operators that may appear at the output. The resulting expressions match very well with results obtained through simulations and can be approximated by very simple formulas that provide additional insights.

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Published
2025-03-19
DOI
https://doi.org/10.1109/ciss64860.2025.10944760
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00

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article

Analysis of Simplified Circuit Level Noise in T Gate Implementation

Javier Garcia‐Frias, Yumin Li
VLSI and Analog Circuit Testing
article

Analysis of Simplified Circuit Level Noise in T Gate Implementation

Javier Garcia‐Frias, Yumin Li
article en

Abstract

We study the effect of simplified circuit level noise, consisting of the introduction of depolarizing errors at the input of any quantum gate, in two different implementations of a physical T gate. Both implementations use a magic state and Clifford operations, but one of them utilizes an additional ancilla that allows the reutilization of the magic state in future quantum operations. We assess the degradation experienced by the implemented T gates (due to error propagation) compared with ideal T gates by obtaining, as a function of the depolarizing probability, closed-form expressions for the probability of the error operators that may appear at the output. The resulting expressions match very well with results obtained through simulations and can be approximated by very simple formulas that provide additional insights.

University of Delaware (US)
National Science Foundation
Affordable and clean energy
Openalex Percentile: Top 94%
VLSI and Analog Circuit Testing
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