LLMUZZ: LLM-based seed optimization for black-box device fuzzing

As an increasing number of Internet of Things (IoT) devices are being deployed, the threat from vulnerabilities inside these devices is growing. Fuzzing is a primary method used for discovering vulnerabilities in IoT devices. The quality of the initial seeds and the seed mutation strategy are two crucial components of fuzzing that largely determine the effectiveness of the fuzzing process. However, owing to the diversity of IoT devices and the highly structured nature of inputs, designing universal seed generation and mutation strategies is extremely challenging. In this paper, we propose LLMUZZ, which is a large language model (LLM)-based black-box fuzzing approach for IoT devices. Specifically, we employ prompt engineering techniques in few-shot learning, using HTML form data from frontend files and an example HTTP request as inputs to LLMs to generate initial seeds. Then, we input the requests to be mutated into LLMs to identify the fields requiring mutation, thereby assisting in the seed mutation process. This approach ensures that the mutated seeds remain valid. Additionally, static analysis methods are utilized to discover hidden keywords within the firmware, thereby further expanding the initial seeds. In the experiments, we implement a prototype of LLMUZZ and evaluate it on 8 different IoT devices. A total of 16 previously unknown vulnerabilities are found, for which we have received 4 CVEs; the remaining vulnerabilities still under review, demonstrating that LLMUZZ has a strong capacity for vulnerability discovery.

Authors

Institutions

Publication Details

Published
2024-12-17
DOI
https://doi.org/10.1109/trustcom63139.2024.00171
Citations
2
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.98

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

LLMUZZ: LLM-based seed optimization for black-box device fuzzing

Shuitao Gan, Guangming Gao, Shenglong Zhu, Xiaofeng Wang
2 citations
VLSI and Analog Circuit Testing
0.98
article

LLMUZZ: LLM-based seed optimization for black-box device fuzzing

Shuitao Gan, Guangming Gao, Shenglong Zhu, Xiaofeng Wang
article en
2 citations

Abstract

As an increasing number of Internet of Things (IoT) devices are being deployed, the threat from vulnerabilities inside these devices is growing. Fuzzing is a primary method used for discovering vulnerabilities in IoT devices. The quality of the initial seeds and the seed mutation strategy are two crucial components of fuzzing that largely determine the effectiveness of the fuzzing process. However, owing to the diversity of IoT devices and the highly structured nature of inputs, designing universal seed generation and mutation strategies is extremely challenging. In this paper, we propose LLMUZZ, which is a large language model (LLM)-based black-box fuzzing approach for IoT devices. Specifically, we employ prompt engineering techniques in few-shot learning, using HTML form data from frontend files and an example HTTP request as inputs to LLMs to generate initial seeds. Then, we input the requests to be mutated into LLMs to identify the fields requiring mutation, thereby assisting in the seed mutation process. This approach ensures that the mutated seeds remain valid. Additionally, static analysis methods are utilized to discover hidden keywords within the firmware, thereby further expanding the initial seeds. In the experiments, we implement a prototype of LLMUZZ and evaluate it on 8 different IoT devices. A total of 16 previously unknown vulnerabilities are found, for which we have received 4 CVEs; the remaining vulnerabilities still under review, demonstrating that LLMUZZ has a strong capacity for vulnerability discovery.

Jiangnan University (CN), Peng Cheng Laboratory (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 21%
VLSI and Analog Circuit Testing
0.98
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.