Experimental and Mechanistic Study on the Calibration of High-<i>g</i> Accelerometers With Different Pulsewidth Excitations
High-precision accelerometers are crucial in high-speed impact testing and precise detonation control of penetration fuzes. However, calibration results of high-<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">g</i> accelerometers under narrow and wide pulse width impact conditions show certain discrepancies, directly affecting the accelerometers measurement accuracy and application scenarios. This paper focuses on studying the differences in the calibration of high-<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">g</i> accelerometer sensitivity using the narrow pulse-width excitation method of the Hopkinson bar and the wide pulse-width excitation method of the air cannon. The mechanisms behind these differences are quantitatively revealed, and the intrinsic relationship between the two calibration methods is established. First, calibration experiments were conducted on the same batch of accelerometers using both impact methods. Next, the linearity indices of the calibration results from both methods were calculated. Then, the differences in the calibration results of the two methods were analyzed and compared, followed by a detailed quantitative investigation of the underlying mechanisms behind these differences. Finally, an empirical formula was established through linear regression analysis to correlate the calibration results of the two excitation methods. The results indicate that there is indeed a difference in sensitivity between the two calibration methods. This difference is unrelated to the peak value of the excitation acceleration. However, it is mainly influenced by the pulse width of the excitation acceleration and the amplitude-frequency characteristics of the accelerometer.
Authors
- Zhenhai Zhang (ORCID: https://orcid.org/0000-0003-0378-1693)
- Fei Teng (ORCID: https://orcid.org/0000-0002-2993-5390)
Institutions
- Beijing Institute of Technology (CN)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3557827
- Primary Topic
- Advanced MEMS and NEMS Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00