Structural differences in titanium surfaces under low-energy hydrogen ion irradiation: a molecular dynamics and topological data analysis approach

Abstract Microscopic structural changes on Ti surfaces under low-energy (≤30 eV) and perpendicular hydrogen ion (H + , H 2 + ) irradiation were investigated using molecular dynamics simulations and topological data analysis. Under H 2 + irradiation, H retention peaked at 5–7 eV, while H + irradiation decreased monotonically with increasing energy. Detailed analysis for H 2 + irradiation revealed that the retention ratio of two hydrogen atoms composing the H 2 molecule followed a similar trend. Persistence diagrams showed additional ring structures formed by H incorporation, leaving the original Ti ring framework intact. Most new rings comprised one H atom and two Ti atoms, with H-Ti distances contracting at lower irradiation energies. The centers of these rings shifted to shallower regions of the Ti surface with decreasing irradiation energy. These findings underscore the potential of low-energy hydrogen ion irradiation for controlled H incorporation into Ti surfaces, suggesting the atomic-level control of plasma-assisted surface engineering.

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Publication Details

Journal
Japanese Journal of Applied Physics
Published
2025-04-01
DOI
https://doi.org/10.35848/1347-4065/adc8af
Primary Topic
X-ray Diffraction in Crystallography
Type
article
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article

Structural differences in titanium surfaces under low-energy hydrogen ion irradiation: a molecular dynamics and topological data analysis approach

Hu Li, Yohei Kawano, Kosuke Yamamoto, Kazuki Yamada et al.
Japanese Journal of Applied Physics
X-ray Diffraction in Crystallography
article

Structural differences in titanium surfaces under low-energy hydrogen ion irradiation: a molecular dynamics and topological data analysis approach

Hu Li, Yohei Kawano, Kosuke Yamamoto, Kazuki Yamada, Hisashi Higuchi
article en

Abstract

Abstract Microscopic structural changes on Ti surfaces under low-energy (≤30 eV) and perpendicular hydrogen ion (H + , H 2 + ) irradiation were investigated using molecular dynamics simulations and topological data analysis. Under H 2 + irradiation, H retention peaked at 5–7 eV, while H + irradiation decreased monotonically with increasing energy. Detailed analysis for H 2 + irradiation revealed that the retention ratio of two hydrogen atoms composing the H 2 molecule followed a similar trend. Persistence diagrams showed additional ring structures formed by H incorporation, leaving the original Ti ring framework intact. Most new rings comprised one H atom and two Ti atoms, with H-Ti distances contracting at lower irradiation energies. The centers of these rings shifted to shallower regions of the Ti surface with decreasing irradiation energy. These findings underscore the potential of low-energy hydrogen ion irradiation for controlled H incorporation into Ti surfaces, suggesting the atomic-level control of plasma-assisted surface engineering.

Japanese Journal of Applied PhysicsVol. 64(4)
Tokyo Electron (Japan) (JP)
Openalex Percentile: Top 96%
X-ray Diffraction in Crystallography
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Structural differences in titanium surfaces under low-energy hydrogen ion irradiation: a molecular dynamics and topological data analysis approach — Hu Li, Yohei Kawano, et al. · Japanese Journal of Applied Physics (2025) | TGRS Research Map | TGRS