AFM characterization of Multilayered Graphene film used as Hydrogen Sensor

Graphene, the crystalline allotrope of Carbon has phenomenal electrical properties and hence a number of application prospects.Multi-Layered Graphene (MLG) has tremendous application prospects as gas sensors.Thermal CVD performed at atmospheric pressure is a very simple and affordable synthesis technique for growing MLG.In this project we characterized Thermal-CVD grown MLG films with the Atomic Force Microscope (AFM) to determine the optimal growth condition by measuring surface roughness and thickness.The results were verified by both contact and close-contact mode of imaging.It was also determined that increased surface roughness creates additional sites for Hydrogen adsorption.The results agree with other Hydrogen sensor data.