A Low-Cost Approach to Generate MV Distorted Voltage for VT Characterization up to 150 kHz

The increase in disturbances at frequencies higher than 10 kHz in Medium Voltage (MV) grids has led to new metrological challenges related to the accurate characterization of Instrument Transformers (ITs) which serve as the primary element in the measurement chain for the monitoring of these disturbances. In this context, this paper presents a simple architecture of a generation system for the characterization of MV Voltage Transformers (VTs) up to 150 kHz under realistic power system waveforms. It is able to generate a MV tone at power frequency and superimposed disturbances having reduced amplitude and higher frequency. Unlike other approaches recently discussed in scientific literature that need two separate voltage sources, the main advantage of the proposed solution is the use of a single source, by suitably compensating its systematic errors through a simple compensation method. As first application, the experimental tests related to the characterization of two commercial VTs, an inductive VT and a Low Power VT, are discussed.

Authors

Institutions

Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3557104
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

A Low-Cost Approach to Generate MV Distorted Voltage for VT Characterization up to 150 kHz

Palma Sara Letizia, Mario Luiso, Antonio Delle Femine, G. Crotti et al.
IEEE Transactions on Instrumentation and Measurement
Integrated Circuits and Semiconductor Failure Analysis
article

A Low-Cost Approach to Generate MV Distorted Voltage for VT Characterization up to 150 kHz

Palma Sara Letizia, Mario Luiso, Antonio Delle Femine, G. Crotti, Domenico Giordano, Claudio Iodice, Giovanni D’Avanzo
article en

Abstract

The increase in disturbances at frequencies higher than 10 kHz in Medium Voltage (MV) grids has led to new metrological challenges related to the accurate characterization of Instrument Transformers (ITs) which serve as the primary element in the measurement chain for the monitoring of these disturbances. In this context, this paper presents a simple architecture of a generation system for the characterization of MV Voltage Transformers (VTs) up to 150 kHz under realistic power system waveforms. It is able to generate a MV tone at power frequency and superimposed disturbances having reduced amplitude and higher frequency. Unlike other approaches recently discussed in scientific literature that need two separate voltage sources, the main advantage of the proposed solution is the use of a single source, by suitably compensating its systematic errors through a simple compensation method. As first application, the experimental tests related to the characterization of two commercial VTs, an inductive VT and a Low Power VT, are discussed.

IEEE Transactions on Instrumentation and MeasurementVol. 74
University of Campania "Luigi Vanvitelli" (IT), Ricerca sul Sistema Energetico (Italy) (IT), Istituto Nazionale di Ricerca Metrologica (IT)
European Partnership on Metrology
Affordable and clean energy
Openalex Percentile: Top 95%
Integrated Circuits and Semiconductor Failure Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

A Low-Cost Approach to Generate MV Distorted Voltage for VT Characterization up to 150 kHz — Palma Sara Letizia, Mario Luiso, et al. · IEEE Transactions on Instrumentation and Measurement (2025) | TGRS Research Map | TGRS