Lattice Based Double-Layer Traceable Aggregate Signature Scheme for Smart Grid
Smart grid is characterized by complex network structures, decentralized deployment of terminal devices, and huge data processing demands. These place higher requirements on grid data collection and processing efficiency, and need to solve the difficult problem of tracing grid faults. Furthermore, the existing signature schemes fail to provide adequate security against quantum computing attacks. Signature aggregation technology, with its advantages of reducing signature storage overhead and improving verification efficiency, is well-suited for multi-terminal and high-data-volume scenarios in the smart grid. In this paper, we propose a lattice based double-layer traceable aggregate signature (DT-LAS) scheme by introducing an anonymous identity mechanism and ordered aggregate signature technology. DT -LAS enables efficient data aggregation at the edge layer of the smart grid, allows rapid fault node tracing, and safeguards the identities of terminal devices. Theoretical analysis and simulation experiments demonstrate that DT-LAS not only ensures correctness, unforgeability, and quantum-resistant security but also enhances aggregate signature efficiency and enables the tracing of faulty base stations, thus ensuring the safe and efficient operation of the smart grid.
Authors
- Jin Qian (ORCID: https://orcid.org/0000-0002-9368-387X)
- Yan Gao (ORCID: https://orcid.org/0000-0001-9388-6418)
- Liquan Chen (ORCID: https://orcid.org/0000-0002-7202-4939)
- Xinhui Liu (ORCID: https://orcid.org/0000-0002-8171-9214)
- Yinghua Jiang
- Jun Luo (ORCID: https://orcid.org/0000-0002-2032-0381)
Institutions
- Shanghai Electric (China) (CN)
- Southeast University (CN)
Publication Details
- Published
- 2024-12-13
- DOI
- https://doi.org/10.1109/iccc62609.2024.10942230
- Primary Topic
- Smart Grid Security and Resilience
- Type
- article
- Field-Weighted Citation Impact
- 0.00