Molecular direct bonding and transfer of 2D MoS<sub>2</sub> layer over a full 200 mm silicon wafer

Abstract Two-dimensional (2D) materials offer exceptional properties for microelectronics, yet scaling these technologies from laboratory research to industrial applications remains challenging. Processes for growth, transfer, and fabrication require significant adaptation. Direct bonding and transfer without polymer intermediaries are particularly attractive to avoid organic residues and potential defects. This study demonstrates the transfer of 2D MoS 2 layers onto full 200 mm silicon wafers using direct molecular bonding. Additionally, a water-mediated transfer process from the growth substrate to the target wafer is described. With the use of a hydrophobic silicon wafer, over 95% of the 2D material surface is successfully transferred while preserving MoS 2 quality, as verified through photoluminescence characterization.

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Publication Details

Journal
Japanese Journal of Applied Physics
Published
2025-04-01
DOI
https://doi.org/10.35848/1347-4065/adc81c
Citations
1
Primary Topic
Molecular Junctions and Nanostructures
Type
article
Field-Weighted Citation Impact
0.73
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article

Molecular direct bonding and transfer of 2D MoS2 layer over a full 200 mm silicon wafer

Frank Fournel, Paul Brunet, Stéphane Cadot, Lucie Le Van‐Jodin et al.
1 citations
Japanese Journal of Applied Physics
Molecular Junctions and Nanostructures
0.73
article

Molecular direct bonding and transfer of 2D MoS2 layer over a full 200 mm silicon wafer

Frank Fournel, Paul Brunet, Stéphane Cadot, Lucie Le Van‐Jodin, E. Rolland, Thibaut Meyer, Camille Pinchart
article en
1 citations

Abstract

Abstract Two-dimensional (2D) materials offer exceptional properties for microelectronics, yet scaling these technologies from laboratory research to industrial applications remains challenging. Processes for growth, transfer, and fabrication require significant adaptation. Direct bonding and transfer without polymer intermediaries are particularly attractive to avoid organic residues and potential defects. This study demonstrates the transfer of 2D MoS 2 layers onto full 200 mm silicon wafers using direct molecular bonding. Additionally, a water-mediated transfer process from the growth substrate to the target wafer is described. With the use of a hydrophobic silicon wafer, over 95% of the 2D material surface is successfully transferred while preserving MoS 2 quality, as verified through photoluminescence characterization.

Japanese Journal of Applied PhysicsVol. 64(4)
Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), CEA Grenoble (FR), Laboratoire Interdisciplinaire de Physique (FR), Laboratoire d'Électronique des Technologies de l'Information (FR)
Openalex Percentile: Top 30%
Molecular Junctions and Nanostructures
0.73
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