Molecular direct bonding and transfer of 2D MoS<sub>2</sub> layer over a full 200 mm silicon wafer
Abstract Two-dimensional (2D) materials offer exceptional properties for microelectronics, yet scaling these technologies from laboratory research to industrial applications remains challenging. Processes for growth, transfer, and fabrication require significant adaptation. Direct bonding and transfer without polymer intermediaries are particularly attractive to avoid organic residues and potential defects. This study demonstrates the transfer of 2D MoS 2 layers onto full 200 mm silicon wafers using direct molecular bonding. Additionally, a water-mediated transfer process from the growth substrate to the target wafer is described. With the use of a hydrophobic silicon wafer, over 95% of the 2D material surface is successfully transferred while preserving MoS 2 quality, as verified through photoluminescence characterization.
Authors
- Frank Fournel (ORCID: https://orcid.org/0000-0001-6051-3391)
- Paul Brunet (ORCID: https://orcid.org/0000-0002-0115-2976)
- Stéphane Cadot (ORCID: https://orcid.org/0000-0003-3447-3810)
- Lucie Le Van‐Jodin (ORCID: https://orcid.org/0000-0001-6336-1805)
- E. Rolland
- Thibaut Meyer (ORCID: https://orcid.org/0000-0002-4060-5835)
- Camille Pinchart
Institutions
- Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
- CEA Grenoble (FR)
- Laboratoire Interdisciplinaire de Physique (FR)
- Laboratoire d'Électronique des Technologies de l'Information (FR)
Publication Details
- Journal
- Japanese Journal of Applied Physics
- Published
- 2025-04-01
- DOI
- https://doi.org/10.35848/1347-4065/adc81c
- Citations
- 1
- Primary Topic
- Molecular Junctions and Nanostructures
- Type
- article
- Field-Weighted Citation Impact
- 0.73