Optical Setup for Laser-Assisted Bonding With Through-Silicon Microscopy Capabilities
The modern processes for photonic integration impose stringent demands on the design and functionality of high precision bonding assembly setups. In this study, we present the development of a Laser Assisted Bonding (LAB) setup employing bottom irradiation/illumination architectures. The main goal is to demonstrate through-silicon imaging capability enabling alignment of photonic waveguides during the LAB process. The imaging is achieved with a novel optical set-up used also for the simultaneous irradiation laser beam delivery. A proof-of-concept LAB integration of a III/V chip to silicon photonic integrated circuit is demonstrated.
Authors
- Mircea Guină (ORCID: https://orcid.org/0000-0002-9317-8187)
- А. А. Власов (ORCID: https://orcid.org/0000-0001-8839-6721)
- Jukka Viheriälä (ORCID: https://orcid.org/0000-0002-1483-5733)
- Topi Uusitalo (ORCID: https://orcid.org/0000-0002-7953-1036)
- Evgenii Lepukhov
Institutions
- Tampere University (FI)
Publication Details
- Journal
- IEEE Transactions on Components Packaging and Manufacturing Technology
- Published
- 2025-04-02
- DOI
- https://doi.org/10.1109/tcpmt.2025.3557118
- Citations
- 5
- Primary Topic
- Nanofabrication and Lithography Techniques
- Type
- article
- Field-Weighted Citation Impact
- 3.37
Funders
- Academy of Finland
- Business Finland