Thickness gauge design based on high-speed scintillator detector and FPGA
In order to solve the problem that the accuracy of traditional thickness gauge can not meet the requirements of today's production, a thickness gauge based on high-speed scintillator nuclear radiation detector is proposed here. With high-speed scintillator GAGG as the detector core, the thickness gauge takes advantage of GAGG's own high energy resolution and low light decay time properties, as well as the ultra-high stability and real-time performance of the detector's electronic part, and adopts high-speed parallel FPGA to sample and count the output to achieve high-precision measurement. By taking the aluminum baffle as an example, the thickness of several different thickness aluminum baffle is measured. Finally, the experimental results show that the detector has the characteristics of good stability and high accuracy.
Authors
- Haiping Zhou (ORCID: https://orcid.org/0000-0001-7923-3285)
- Chuanhao Hu (ORCID: https://orcid.org/0009-0000-9682-4036)
- Xingwen Dong (ORCID: https://orcid.org/0009-0002-1064-9391)
- Chang Liu (ORCID: https://orcid.org/0000-0002-6967-5159)
- Chaoyuan Li (ORCID: https://orcid.org/0000-0001-5579-0749)
- Jun‐Chao Liu (ORCID: https://orcid.org/0000-0002-9024-859X)
Institutions
- Chengdu University of Technology (CN)
Publication Details
- Published
- 2025-04-02
- DOI
- https://doi.org/10.1117/12.3058494
- Primary Topic
- Radiation Detection and Scintillator Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00