A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness
A novel dual-mode dual trench MOSFET (DDT-MOSFET) featuring shorted P-doping field plate (PFP) and N-doping field plate (NFP) is proposed. A parasitic depletion region capacitor and a parasitic MOSFET are introduced in the self-adjustable field plate (SFP). During turn-on, the DDT-MOSFET is in the split gate trench (SGT) mode with an electron inversion layer in the PFP, achieving low <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$C_{\mathrm { gd}}$ </tex-math></inline-formula>. During turn-off, the DDT-MOSFET is in the insulator pillar superjunction (I-SJ) mode with depleted PFP, achieving low electromagnetic interference (EMI) noise and high breakdown voltage (BV). Mode conversion is realized by the introduction of the SFP. By TCAD simulation, during turn-off, the proposed structure exhibits 33.9% improvement in BV, 42.8% reduction in maximum <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$dI_{\mathrm { D}}$ </tex-math></inline-formula>/dt and 44.1% reduction in overshoot voltage <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$(V_{\mathrm { O}})$ </tex-math></inline-formula> with same <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$E_{\mathrm { off}}$ </tex-math></inline-formula>, reducing EMI noise and improving dynamic avalanche robustness without deterioration of other electrical characteristics.
Authors
- Yishang Zhao (ORCID: https://orcid.org/0000-0001-7285-7503)
- Zehong Li (ORCID: https://orcid.org/0000-0002-6762-2838)
- Ziming Xia
- Tongyang Wang (ORCID: https://orcid.org/0000-0001-9543-4845)
- Jun Ye (ORCID: https://orcid.org/0000-0002-4590-9707)
- Xuan Xiao (ORCID: https://orcid.org/0009-0002-2086-7309)
- Yige Zheng
Institutions
- University of Electronic Science and Technology of China (CN)
- China Resources (China) (CN)
- National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
Publication Details
- Journal
- IEEE Transactions on Device and Materials Reliability
- Published
- 2025-04-01
- DOI
- https://doi.org/10.1109/tdmr.2025.3556015
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00