Experiments in Micro-/Nano- Characterization of Material Surfaces

This paper describes eight experiments developed for a 4-quarter credit hour upper-division technical elective course on Micro-and Nano-Characterization of Material Surfaces.The course has 3 hours/week of lectures and a 2 hours/week laboratory segment.Offered for the second time last Spring quarter, the course has attracted students from mechanical engineering, microelectronic engineering, materials science and engineering as well a doctoral student in Microsystems Engineering.The course has become part of a concentration program in Nanotechnology and MEMS being developed under a department-level reform grant from the National Science Foundation to the department of microelectronic engineering.The experiments cover two families of techniques: atomic force microscopy and x-ray diffraction.At the end of each experiment, each student pair is given a different experimental dataset to analyze.Students submit their analysis and results in a written lab report.The paper also describes the format of the lab reports.

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Published
2025-04-01
DOI
https://doi.org/10.18260/1-2-1153-52776
Primary Topic
Surface Roughness and Optical Measurements
Type
article
Field-Weighted Citation Impact
0.00

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Experiments in Micro-/Nano- Characterization of Material Surfaces

Surendra K. Gupta
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Surface Roughness and Optical Measurements
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Experiments in Micro-/Nano- Characterization of Material Surfaces

Surendra K. Gupta
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Abstract

This paper describes eight experiments developed for a 4-quarter credit hour upper-division technical elective course on Micro-and Nano-Characterization of Material Surfaces.The course has 3 hours/week of lectures and a 2 hours/week laboratory segment.Offered for the second time last Spring quarter, the course has attracted students from mechanical engineering, microelectronic engineering, materials science and engineering as well a doctoral student in Microsystems Engineering.The course has become part of a concentration program in Nanotechnology and MEMS being developed under a department-level reform grant from the National Science Foundation to the department of microelectronic engineering.The experiments cover two families of techniques: atomic force microscopy and x-ray diffraction.At the end of each experiment, each student pair is given a different experimental dataset to analyze.Students submit their analysis and results in a written lab report.The paper also describes the format of the lab reports.

Rochester Institute of Technology (US)
National Science Foundation
Openalex Percentile: Top 93%
Surface Roughness and Optical Measurements
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