Ultraviolet absorption of point defects in high purity bulk AlN

Four point defects are analyzed in high purity bulk AlN crystals using electron paramagnetic resonance (EPR) spectroscopy. No EPR could be detected in the dark at temperatures as low at 4 K. The neutral donor and a newly detected center, M1, are observed during and after illumination with visible and near ultraviolet (UV) light, while two other defects are detected only during exposure to near and deep UV radiation. One is the neutral charge state of the carbon acceptor, and it, along with a second newly observed center, M2, are observed between 4 and 4.7 eV. Both M1 and M2 represent high spin centers and are stable in their EPR active charge state up to 373–473 K (100–200 °C). These centers must be considered as AlN advances toward a functional photonic and electronic material.

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Publication Details

Journal
AIP Advances
Published
2025-04-01
DOI
https://doi.org/10.1063/5.0261981
Citations
1
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.26

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article

Ultraviolet absorption of point defects in high purity bulk AlN

M. E. Zvanut, Md Shafiqul Islam Mollik
1 citations
AIP Advances
GaN-based semiconductor devices and materials
1.26
article

Ultraviolet absorption of point defects in high purity bulk AlN

M. E. Zvanut, Md Shafiqul Islam Mollik
article en
1 citations

Abstract

Four point defects are analyzed in high purity bulk AlN crystals using electron paramagnetic resonance (EPR) spectroscopy. No EPR could be detected in the dark at temperatures as low at 4 K. The neutral donor and a newly detected center, M1, are observed during and after illumination with visible and near ultraviolet (UV) light, while two other defects are detected only during exposure to near and deep UV radiation. One is the neutral charge state of the carbon acceptor, and it, along with a second newly observed center, M2, are observed between 4 and 4.7 eV. Both M1 and M2 represent high spin centers and are stable in their EPR active charge state up to 373–473 K (100–200 °C). These centers must be considered as AlN advances toward a functional photonic and electronic material.

AIP AdvancesVol. 15(4)
University of Alabama at Birmingham (US)
U.S. Department of Energy, Office of Science, Basic Energy Sciences
Openalex Percentile: Top 23%
GaN-based semiconductor devices and materials
1.26
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