Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?”

Presents corrections to the paper, Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?”.

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Journal
IEEE Sensors Journal
Published
2025-04-01
DOI
https://doi.org/10.1109/jsen.2025.3533876
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?”

Rathlavath Priyanka, L. Chandrasekar, K P Pradhan, Rameez Raja Shaik
IEEE Sensors Journal
Integrated Circuits and Semiconductor Failure Analysis
article

Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?”

Rathlavath Priyanka, L. Chandrasekar, K P Pradhan, Rameez Raja Shaik
article en

Abstract

Presents corrections to the paper, Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?”.

IEEE Sensors JournalVol. 25(7)
Indian Institute of Information Technology, Design and Manufacturing, Kancheepuram (IN)
Openalex Percentile: Top 95%
Integrated Circuits and Semiconductor Failure Analysis
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Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?” — Rathlavath Priyanka, L. Chandrasekar, et al. · IEEE Sensors Journal (2025) | TGRS Research Map | TGRS