The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current

Arresters on electric multiple units (EMUs) usually experience premature aging under a high-frequency voltage and impulse current. In addition, they lead to overheating faults when subjected to the high-frequency overvoltage of electric railways. This research investigates the aging behavior of arresters when subjected to overvoltage and an impact current. An analysis was conducted on the impact of the aging duration at 1 mA and the frequency of overvoltage on a lightning arrester’s outer-layer components. The results show that the 1 mA DC reference voltage of the MOA sheet decreased, and the leakage current significantly increased at a 0.75 DC reference voltage through the aging of high-frequency voltage, and the duration of the applied voltage and the voltage bearing rate had similar effects on the two parameters. After aging, the Co and Bi elements on the surface of zinc oxide decreased and migrated to the depletion layer, resulting in a decrease in the dispersion characteristics of the zinc oxide agglomerate surface. Under the impulse voltage, the thermal stress on the surface of the zinc oxide increased, resulting in the damage to the zinc oxide grains, which aggravated the thermal stress concentration and reduced the performance of the zinc oxide. This study reveals the deterioration mechanism of high-frequency voltage- and impulse current gap-modulated MOA materials and provides a theoretical basis and data support for the development of and monitoring methods for new lightning arresters.