Innovative Deep Learning Techniques for Solving Complex Computer Vision Challenges and Enhancing Pattern Recognition Accuracy

The proposed work provides an in-depth analysis of DL techniques to enhance pattern recognition accuracy in difficult computer vision applications. This background explains the present status of the problems in the area and motivates the development of a complex framework that blends innovative neural network topologies, state-of-the-art optimization approaches, and inventive data augmentation strategies. Among the methods are CNNs enhanced with residual blocks and attention mechanisms, which are implemented using the TensorFlow deep learning framework. The results demonstrate significant improvements over baseline models on a number of measures. Using the CIFAR-10 dataset, the proposed system achieves an impressive 92.5% accuracy and 92.1% F1-score for classification tasks. With an IoU of 78.2% and a mAP of 81.4% in object identification tasks, the system shows its robustness in accurately localizing and recognizing things within photos. These findings have practical ramifications for industries needing accurate visual identification, such autonomous driving and medical imaging, in addition to advancing theoretical knowledge. The efficacy of the architecture highlights its potential to serve as a benchmark for next deep learning studies and applications.

Authors

Institutions

Publication Details

Published
2024-09-20
DOI
https://doi.org/10.1109/icdscnc62492.2024.10941565
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Innovative Deep Learning Techniques for Solving Complex Computer Vision Challenges and Enhancing Pattern Recognition Accuracy

S. Sathya, Mohammed Waheeduddin Hussain, R. Jothikumar, T. Jayachitra et al.
Industrial Vision Systems and Defect Detection
article

Innovative Deep Learning Techniques for Solving Complex Computer Vision Challenges and Enhancing Pattern Recognition Accuracy

S. Sathya, Mohammed Waheeduddin Hussain, R. Jothikumar, T. Jayachitra, P Swetha, Gouri M. S
article en

Abstract

The proposed work provides an in-depth analysis of DL techniques to enhance pattern recognition accuracy in difficult computer vision applications. This background explains the present status of the problems in the area and motivates the development of a complex framework that blends innovative neural network topologies, state-of-the-art optimization approaches, and inventive data augmentation strategies. Among the methods are CNNs enhanced with residual blocks and attention mechanisms, which are implemented using the TensorFlow deep learning framework. The results demonstrate significant improvements over baseline models on a number of measures. Using the CIFAR-10 dataset, the proposed system achieves an impressive 92.5% accuracy and 92.1% F1-score for classification tasks. With an IoU of 78.2% and a mAP of 81.4% in object identification tasks, the system shows its robustness in accurately localizing and recognizing things within photos. These findings have practical ramifications for industries needing accurate visual identification, such autonomous driving and medical imaging, in addition to advancing theoretical knowledge. The efficacy of the architecture highlights its potential to serve as a benchmark for next deep learning studies and applications.

Shadan Hospital and Institute of Medical Sciences (IN), Sharda University (IN), Vellore Institute of Technology University (IN)
Openalex Percentile: Top 57%
Industrial Vision Systems and Defect Detection
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Innovative Deep Learning Techniques for Solving Complex Computer Vision Challenges and Enhancing Pattern Recognition Accuracy — S. Sathya, Mohammed Waheeduddin Hussain, et al. · (2024) | TGRS Research Map | TGRS