Innovative Deep Learning Techniques for Solving Complex Computer Vision Challenges and Enhancing Pattern Recognition Accuracy
The proposed work provides an in-depth analysis of DL techniques to enhance pattern recognition accuracy in difficult computer vision applications. This background explains the present status of the problems in the area and motivates the development of a complex framework that blends innovative neural network topologies, state-of-the-art optimization approaches, and inventive data augmentation strategies. Among the methods are CNNs enhanced with residual blocks and attention mechanisms, which are implemented using the TensorFlow deep learning framework. The results demonstrate significant improvements over baseline models on a number of measures. Using the CIFAR-10 dataset, the proposed system achieves an impressive 92.5% accuracy and 92.1% F1-score for classification tasks. With an IoU of 78.2% and a mAP of 81.4% in object identification tasks, the system shows its robustness in accurately localizing and recognizing things within photos. These findings have practical ramifications for industries needing accurate visual identification, such autonomous driving and medical imaging, in addition to advancing theoretical knowledge. The efficacy of the architecture highlights its potential to serve as a benchmark for next deep learning studies and applications.
Authors
- S. Sathya
- Mohammed Waheeduddin Hussain
- R. Jothikumar
- T. Jayachitra (ORCID: https://orcid.org/0000-0002-4652-4171)
- P Swetha (ORCID: https://orcid.org/0009-0002-2527-7121)
- Gouri M. S
Institutions
- Shadan Hospital and Institute of Medical Sciences (IN)
- Sharda University (IN)
- Vellore Institute of Technology University (IN)
Publication Details
- Published
- 2024-09-20
- DOI
- https://doi.org/10.1109/icdscnc62492.2024.10941565
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00