Using multi-method analysis to identify challenging paper machine deposits and defects

Based on its speed and versatility, Fourier transform infrared (FTIR) spectroscopy is the industry’s common starting point for analysis of a paper machine deposit or defect sample. However, certain contaminants and papermaking process additives cannot be precisely identified solely by infrared spectral interpretation. This lack of specificity could lead to a misinterpretation of the composition of the deposit or defect. A multi-method analysis uses data from two or more analytical techniques, including FTIR spectroscopy, microbiological staining/phase contrast microscopy, pyrolysis-gas chromatography/mass spectrometry (Pyro-GC/MS), and scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDX), to produce a more specific assessment of a sample’s composition. This paper discusses the use of a multi-method analysis in deposit and defect analysis and presents several case studies that demonstrate how this comprehensive approach can often produce an interpretation result of greater conviction and value to the papermaker.